A novel method for RF device's contact test

Abstract

A novel method for RF device's contact test is proposed to improve the yield of the RFIC test employing test less technique. An equivalent circuit for modeling the RF device incorporating RF traces with contact impedance is applied for theoretical analysis of prototype design. Measured data of RF devices testing attained in production runs precisely address the contact issue using the novel methodology present here.Index Terms -Auto Test Equipment (ATE); System-inPackage (SiP); Multi-Chip Module (MCM).

Low-Loss Pogo Pin Probe Card with a Coupling Isolation Structure up to 50 GHz

“…Research on pogo pins that can be used in the RF band has recently received greater attention. In particular, there has been a focus on the use of pogo pins in the high-frequency band, based on the analysis of pogo pin characteristic impedance and the optimal pogo pin structure in various GHz bands [ 9 ] and the development of RF test models with pogo pins [ 10 , 11 , 12 ]. Although pogo pins are frequently used in low-frequency bands below MHz signals [ 13 ] without impedance analysis, analysis of the characteristic impedance of pogo pins themselves in the millimeter wave band is important.…”