2005 International Conference on Computer Design
DOI: 10.1109/iccd.2005.13
|View full text |Cite
|
Sign up to set email alerts
|

A novel method of improving transition delay fault coverage using multiple scan enable signals

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
8
0

Publication Types

Select...
4
1
1

Relationship

1
5

Authors

Journals

citations
Cited by 14 publications
(8 citation statements)
references
References 14 publications
0
8
0
Order By: Relevance
“…A strategy based on multiple independent scan enable signals allows a portion of the SFFs to be in a shift-launch mode while the others are in a functional-launch mode [7,8]. The coverage obtained with this technique is lower than that provided by LOS, while the number of test patterns is increased by as much as 46% with respect to LOC.…”
Section: Los Emulation Strategiesmentioning
confidence: 95%
“…A strategy based on multiple independent scan enable signals allows a portion of the SFFs to be in a shift-launch mode while the others are in a functional-launch mode [7,8]. The coverage obtained with this technique is lower than that provided by LOS, while the number of test patterns is increased by as much as 46% with respect to LOC.…”
Section: Los Emulation Strategiesmentioning
confidence: 95%
“…The method proposed in this paper is motivated by our recent work in [7,8] which was inspired by the work in [6]. In the current work as well as in [7,8], groups of flip-flops are connected to independent scan enable signals.…”
Section: Earlier Methods For Improving Delay Fault Coverage In Standamentioning
confidence: 99%
“…In the current work as well as in [7,8], groups of flip-flops are connected to independent scan enable signals. As described later in Sec 2.2, higher fault coverage is achieved by asserting some of the scan enable signals active (high) during the launch and capture cycles.…”
Section: Earlier Methods For Improving Delay Fault Coverage In Standamentioning
confidence: 99%
See 1 more Smart Citation
“…[12] avoided the need for an at-speed scan enable by using the LOS flip-flops (along with LOC flip-flops) only to launch the TDF timing test; the test response was only captured and observed by the flip-flops operating in the LOC mode. While this combination of LOC and LOS modes led to some increase in the available test launch states, test output observability will be significantly impact by restricting the response capture to the LOC flip-flops.…”
Section: Targeting Opens Undetectable By Traditional Timing Unawamentioning
confidence: 99%