“…scanning electron microscopy (SEM) and transmission electron microscopy (TEM)) in studies of metallic surfaces and micro-structures by providing reliable measurements at the nanometer scale [37,57,75,121,123]. AFM can also be used for nanoindentation to provide in situ imaging ability without moving the sample, switching tips, relocating the area for scanning, or using an entirely different instrument to image the indentation [35,56,71,102,118]. Force modulation microscopy (FMM) which is an extension of AFM imaging, is used extensively for the characterization of mechanical properties and in applications such as imaging composition changes in a composite material, analyzing polymer homogeneity, and detecting contaminants in manufacturing processes [3,27,99].…”