2008
DOI: 10.1088/1367-2630/10/3/033018
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A novel position-sensitive detector based on metal–oxide–semiconductor structures of Co–SiO2–Si

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Cited by 34 publications
(23 citation statements)
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“…The LPE is generally acknowledged as an attribute characteristic of some semiconductor materials since being discovered by Schottky and expanded upon by Wallmark in floating Ge p‐n junctions . Hitherto, LPE gets widely used in photoelectric detection and is considered as an effective method to measure the characteristics of materials . A deeper understanding of hot functional materials, including transition metal dichalcogenides (TMDCs), carbon isotope, III‐V compound semiconductor, MS, and graphene, could be learned from experiments of LPE.…”
Section: Lateral Photovoltaic Effectmentioning
confidence: 99%
“…The LPE is generally acknowledged as an attribute characteristic of some semiconductor materials since being discovered by Schottky and expanded upon by Wallmark in floating Ge p‐n junctions . Hitherto, LPE gets widely used in photoelectric detection and is considered as an effective method to measure the characteristics of materials . A deeper understanding of hot functional materials, including transition metal dichalcogenides (TMDCs), carbon isotope, III‐V compound semiconductor, MS, and graphene, could be learned from experiments of LPE.…”
Section: Lateral Photovoltaic Effectmentioning
confidence: 99%
“…Alternatively, other Schottky barrier structures, some of which include oxides, have shown very high sensitivities, some as high as 97 mV/mm, but suffer from quite short linear regions of about 4 mm [8], [9].…”
Section: Introductionmentioning
confidence: 99%
“…The wavelength of the laser we used is 532 nm with a power of 50 mW. Experimental details are similar to our previous papers [16].…”
mentioning
confidence: 99%