2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) 2010
DOI: 10.1109/aspdac.2010.5419897
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A novel Si-Tunnel FET based SRAM design for ultra low-power 0.3V VDD applications

Abstract: Steep sub-threshold transistors are promising candidates to replace the traditional MOSFETs for sub-threshold leakage reduction. In this paper, we explore the use of Inter-Band Tunnel Field Effect Transistors (TFETs) in SRAMs at ultra low supply voltages. The uni-directional current conducting TFETs limit the viability of 6T SRAM cells. To overcome this limitation, 7T SRAM designs were proposed earlier at the cost of extra silicon area. In this paper, we propose a novel 6T SRAM design using Si-TFETs for reliab… Show more

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Cited by 76 publications
(49 citation statements)
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“…To perform circuit simulations, we capture the I d -V g transfer characteristics of the CMOS and the HTFET obtained using the models discussed in section II-A, in a Verilog-A lookup table [14], [15], [16]. Because of delayed onset of saturation in the HTFET, the Voltage Transfer Characteristics (VTC) of a HTFET inverter are considerably degraded compared to that of a CMOS inverter, as shown in Fig.…”
Section: A Tfet and Cmos Device Modelsmentioning
confidence: 99%
“…To perform circuit simulations, we capture the I d -V g transfer characteristics of the CMOS and the HTFET obtained using the models discussed in section II-A, in a Verilog-A lookup table [14], [15], [16]. Because of delayed onset of saturation in the HTFET, the Voltage Transfer Characteristics (VTC) of a HTFET inverter are considerably degraded compared to that of a CMOS inverter, as shown in Fig.…”
Section: A Tfet and Cmos Device Modelsmentioning
confidence: 99%
“…A table look up model approach is used for TFET circuit simulation due to the unavailability of physics based compact analytical model for TFET. The circuit simulations on commercial device simulators does not work properly for TFET based complementary circuits [33], and an equivalent circuit [34] or a table look up model based approach is required to perform logic circuit analysis. This tool has already been used to study the device and circuit performance of carbon nanotube p-i-n TFET [35].…”
Section: Circuit Level Performance Comparisonmentioning
confidence: 99%
“…By comparing those designs on several aspects (e.g. frequency, noise margins, power, and area), in this study, we apply the 6T TFET SRAM proposed by Singh et al [14] to implement the TFET-based register files.…”
Section: 2tunneling Field Effect Transistors (Tfets)mentioning
confidence: 99%
“…Recently, many different TFET SRAMs have been explored to overcome this limitation [14][15][16][17]. By comparing those designs on several aspects (e.g.…”
Section: 2tunneling Field Effect Transistors (Tfets)mentioning
confidence: 99%