2013
DOI: 10.1016/j.microrel.2013.07.025
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A novel soldering method to evaluate PCB pad cratering for pin-pull testing

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Cited by 6 publications
(1 citation statement)
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“…They are presented in more detail in [ 20 ], including the description of their benefits and drawbacks. Cia et al [ 21 ] took advantage of the pin pull method to evaluate pad cratering after multiple reflows and accelerated thermal cycling. Susceptibility to pad cratering is influenced by the reflow profile peak temperature, and thermal aging plays an important role if the temperature is above Tg [ 22 ].…”
Section: Introductionmentioning
confidence: 99%
“…They are presented in more detail in [ 20 ], including the description of their benefits and drawbacks. Cia et al [ 21 ] took advantage of the pin pull method to evaluate pad cratering after multiple reflows and accelerated thermal cycling. Susceptibility to pad cratering is influenced by the reflow profile peak temperature, and thermal aging plays an important role if the temperature is above Tg [ 22 ].…”
Section: Introductionmentioning
confidence: 99%