2016
DOI: 10.17531/ein.2016.3.11
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A novel Wiener process model with measurement errors for degradation analysis

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Cited by 9 publications
(6 citation statements)
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“…Combining equations (16) and (17), the mean value of the posterior distribution of u 1 is D Z 11k =Dt 11k , and the scale parameter is s 2 Dt 11k =n. The shape parameter of the posterior distribution of e 2 1 is (n À 1)=2, and the scale parameter is ((n À 1)S 2 )=2Dt 11k .…”
Section: Degradation Model Of Led Driving Power Based On Wiener Processmentioning
confidence: 99%
See 2 more Smart Citations
“…Combining equations (16) and (17), the mean value of the posterior distribution of u 1 is D Z 11k =Dt 11k , and the scale parameter is s 2 Dt 11k =n. The shape parameter of the posterior distribution of e 2 1 is (n À 1)=2, and the scale parameter is ((n À 1)S 2 )=2Dt 11k .…”
Section: Degradation Model Of Led Driving Power Based On Wiener Processmentioning
confidence: 99%
“…From equation (17), it can be observed that the posterior distribution of e 2 a is proportional to the PDF of the inverse gamma distribution. The shape parameter is (n À 1)=2 and the scale parameter is ((n À 1)S 2 )=2.…”
Section: Degradation Model Of Led Driving Power Based On Wiener Processmentioning
confidence: 99%
See 1 more Smart Citation
“…Let now analyze the degradation data of IRLEDs tested at 320 mA, initially given in Yang and partially used by Wang et al Such data refer to m = 15 units, which were inspected for luminous power before and during testing.…”
Section: Numerical Applicationmentioning
confidence: 99%
“…The degradation model based on Wiener process has obvious advantages in mathematics [8]. Wiener process has been widely applied in many fields [9][10][11]. Wang proposed a reliability assessment method that fused both prior and on-site degradation data [12].…”
Section: Introductionmentioning
confidence: 99%