Abstract:Surface sensitive in-situ techniques are helpful to get a deeper understanding of electrochemical reactions because they can give information about electrode reaction products during the reaction process. Structural and phase properties of thin solid films are commonly measured by grazing incident X-ray diffraction. Ex-situ measurements are sometimes not feasible because of alteration of deposits in contact with air, moisture or aging within the time gap between formation and measurement. Therefore in-situ X-r… Show more
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