Abstract:We present a simulation study on the peeling of carbon nanotubes bundles interacting with a flat substrate, represented by the back surface of an atomic force microscopy cantilever. A defected sample, acquired in situ using a scanning electron microscope, was investigated under different peeling configurations by finite element method simulations. The coupled computational-experimental analysis let to identify the position and the entity of a structural defect by means of reverse image correlation problem. By … Show more
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