The field of lightâscattering characterization of single particles has seen a rapid growth over the last 30 years largely due to the progress in measurement and simulation capabilities. In particular, several methods have been developed to reliably characterize various particles, described by a model with several characteristics, with geometric resolution significantly better than the diffraction limit. However, their development has been largely fragmentary, limited to specific experimental setâups. To fill this gap, these lines of development are reviewed within a unified framework. While focusing on characterization algorithms themselves, the experimental aspects related to the isolation and measurement of single particles are also discussed. The existing characterization methods are divided into three classes. The widest class is that of modelâdriven methods based on solving parametric inverse lightâscattering problems, using a direct inversion of a lowâdimensional mapping, a nonlinear regression, or neural networks. Other classes include modelâfree reconstruction methods and dataâdriven classification methods. This review is designed to be extensive in including all relevant literature, but the discussion of semiâquantitative imaging methods, such as tomography or holographyâbased reconstruction, is deliberately omitted. Throughout the review the development of various characterization methods is described, they are critically compared, and promising directions of future research are highlighted.