2012
DOI: 10.3221/igf-esis.23.11
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A numerical study of squeeze-film damping in MEMS-based structures including rarefaction effects

Abstract: In a variety of MEMS applications, the thin film of fluid responsible of squeeze-film damping results to be rarefied and, thus, not suitable to be modeled though the classical Navier-Stokes equation. The simplest way to consider fluid rarefaction is the introduction of a slight modification into its ordinary formulation, by substituting the standard fluid viscosity with an effective viscosity term. In the present paper, some squeeze-film damping problems of both parallel and torsion plates at decreasing pressu… Show more

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Cited by 11 publications
(16 citation statements)
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“…In the device structure, the air-gap height ( h ) is at least 35 μm. As a result, we have K n < 0.01, and the fluid between the proof mass and substrate can be considered as a continuum [ 22 ]. The behavior of the continuous fluid can be governed by the linearized Reynolds equation, based on the hypotheses of small amplitude displacement of the proof mass and small squeeze number [ 23 ], which is applicable for this study.…”
Section: Design and Fem Simulationmentioning
confidence: 99%
“…In the device structure, the air-gap height ( h ) is at least 35 μm. As a result, we have K n < 0.01, and the fluid between the proof mass and substrate can be considered as a continuum [ 22 ]. The behavior of the continuous fluid can be governed by the linearized Reynolds equation, based on the hypotheses of small amplitude displacement of the proof mass and small squeeze number [ 23 ], which is applicable for this study.…”
Section: Design and Fem Simulationmentioning
confidence: 99%
“…Gas flowage in the cavity can be characterized by the Knudsen number Kn=λd where λ is the mean free path of the molecules, and d is the gas film depth in normal direction of gas surface [20,25]. …”
Section: Numerical Multiphysics Simulationsmentioning
confidence: 99%
“…The advantage of using the finite-element method lies in the ability to model arbitrary device geometries and boundary conditions. In the case where the rotor moves normally with respect to the top glass wafer along the z -axis, the squeeze film damping coefficient is evaluated as [20] bz=truep(x,y)dxdyvz where p ( x , y ) is the pressure field over the moving rotor.…”
Section: Numerical Multiphysics Simulationsmentioning
confidence: 99%
“…For the gas film between the proof mass and substrate, the gap height . As such, we have , and thus the fluid is in the continuum regime [ 18 ]. The behavior of the continuous fluid is generally governed by the well-known Reynolds equation [ 19 ].…”
Section: Device Designmentioning
confidence: 99%