“…The literature (Li LF, Rao D, Fan R, Zhang H, Wang J, Luo HY, Liu Z & Xu GH, 2022) takes the pre-processed traveling wave data and trains the data using Long-Short term Memory (LSTM) networks. In the literature (Liu F, Li YK, Gao F, et al, 2021), wavelet scattering feature extraction is performed on the fault zero sequence current signal to obtain the fault feature vector, which is then input to the Bi-LSTM network for training. The literature (R. Resmi, V. Vanitha, E. Aravind, B. R. Sundaram, C. R. Aswin & S. Harithaa, 2019) provides all the collected three-phase voltages and currents to the Artificial Neural Network (ANN) algorithm for detecting the fault type.…”