2012
DOI: 10.1016/j.cpc.2012.06.011
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A parameterization of nuclear track profiles in CR-39 detector

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Cited by 24 publications
(19 citation statements)
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“…21 The noticed that V B can vary from one experiment to another, even if the same detector material as well as etching conditions (solution concentration, temperature, and etching time) are used. Azooz et al 12 also found that the bulk etching rate of the CR-39 material achieved values between 1.32 and 1.43 μm/h for the same etching conditions as were used in our studies. In most codes which simulate the track profiles, the bulk etch rates, V B , are assumed to have constant values (time independent).…”
Section: Resultsmentioning
confidence: 65%
See 1 more Smart Citation
“…21 The noticed that V B can vary from one experiment to another, even if the same detector material as well as etching conditions (solution concentration, temperature, and etching time) are used. Azooz et al 12 also found that the bulk etching rate of the CR-39 material achieved values between 1.32 and 1.43 μm/h for the same etching conditions as were used in our studies. In most codes which simulate the track profiles, the bulk etch rates, V B , are assumed to have constant values (time independent).…”
Section: Resultsmentioning
confidence: 65%
“…5,6 The problem of the development and simulation of etched track profiles in CR-39 material and comparison with experimental results for light ions of different kinds and energies has been the subject of many studies in recent years. [7][8][9][10][11][12][13] The currently existing computer programs calculate the depth, diameter, range, saturation time, and etch rates versus etching time. The simulation programs reasonably approximate the experimental three dimensional track images for protons, α particles, and Li ions.…”
Section: Introductionmentioning
confidence: 99%
“…Due to the fact that some data for protons at several energies from reference (16) were used in previous works (14,15) …”
Section: The Datamentioning
confidence: 99%
“…However, almost all such modeling are related to protons and alpha particles tracks. *Email: mushtaq_phy8@yahoo.com It is our purpose here to further extend the modeling carried out in references (14,15) which was limited to protons and alpha particles tracks only, to be able to describe track depth development for heavier ions. These include D, Li, B, C, N, and O.…”
Section: Introductionmentioning
confidence: 99%
“…Another method is based on using the confocal microscope through the 3D-imaging technique of the track shapes [7,8,14], or that based on the contact stylus profilometry through measuring the replica heights of the etched tracks [9,15]. In our previous works [10,16,17], including this paper, the "lateral irradiation method" have been used to obtain the track images and depths based on irradiating the side edge of the detector. This method is straightforward and easier than the previously mentioned ones as there is no need for a complicated system.…”
Section: Introductionmentioning
confidence: 99%