2019
DOI: 10.3390/electronics8070725
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A Parametric Conducted Emission Modeling Method of a Switching Model Power Supply (SMPS) Chip by a Developed Vector Fitting Algorithm

Abstract: This paper proposes a modeling method to establish a parametric-conducted emission model of a switching model power supply (SMPS) chip through a developed vector fitting algorithm. A common SMPS chip LTM8025 was taken as an example to explain the modeling process. According to the integrated circuit (IC) electromagnetic modeling (ICEM) standard, the parametric conducted emission model is divided into two parts: IC internal activity (ICIA) and IC passive distribution network (ICPDN). The parameters of ICIA are … Show more

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Cited by 3 publications
(4 citation statements)
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References 25 publications
(44 reference statements)
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“…In addition to the research in the inverter topologies, this issue has collected important research on isolated [17,18] and non-isolated [19][20][21][22] DC-DC power converters and rectifiers [23,24]. In Reference [17], a comparative evaluation of some wide-range soft-switching full-bridge modular multilevel DC-DC converters is discussed.…”
Section: The Current Research Trendsmentioning
confidence: 99%
See 2 more Smart Citations
“…In addition to the research in the inverter topologies, this issue has collected important research on isolated [17,18] and non-isolated [19][20][21][22] DC-DC power converters and rectifiers [23,24]. In Reference [17], a comparative evaluation of some wide-range soft-switching full-bridge modular multilevel DC-DC converters is discussed.…”
Section: The Current Research Trendsmentioning
confidence: 99%
“…A power-based space vector modulation technique for a matrix rectifier is proposed in [23], where the modulation index and applied phase are calculated, based on the active and reactive power of the rectifier for intuitive power factor control. In Reference [24], a modeling method is introduced to establish a parametric-conducted emission model of a switching model power supply chip through a developed vector fitting algorithm.…”
Section: The Current Research Trendsmentioning
confidence: 99%
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“…Currently, there is only limited literature that has focused on the problems caused by electromagnetic interference [1][2][3][4][5], which is a challenge faced by every single electronics developer. The design of electronic devices is subject to various limitations in the initial stage, which increases the difficulty that arises from reaching a balance between the quality of signal and electromagnetic interference.…”
Section: Introductionmentioning
confidence: 99%