A Parasitics-Induced Failure Mechanism for Transistors in the Bit-Line Sense Amplifier Region of DDP DDR3 DRAM During a CDM Event

Lim, Dongju; Seung, Manho; Lee, Yoonsung; Lee, Seokkiu; Kim, Chulwoo

doi:10.1109/tdmr.2019.2950222

IEEE Trans. Device Mater. Relib.

2019

DOI: 10.1109/tdmr.2019.2950222

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A Parasitics-Induced Failure Mechanism for Transistors in the Bit-Line Sense Amplifier Region of DDP DDR3 DRAM During a CDM Event

Dongju Lim

Manho Seung

Yoonsung Lee

et al.

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A Parasitics-Induced Failure Mechanism for Transistors in the Bit-Line Sense Amplifier Region of DDP DDR3 DRAM During a CDM Event

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References 10 publications

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