1976
DOI: 10.1088/0022-3719/9/12/017
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A percolation treatment of high-field hopping transport

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Cited by 214 publications
(136 citation statements)
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“…In view of the above-described structural measurements, that is, HR-TEM and Raman results of the GO, hopping presumably occurs between the intact graphitic grains, which are separated by clusters of atomic defects. The deviation from linear fit at the lower temperautre regime can be explained by the contribution of the field-driven conduction without thermal activation [46][47][48] . However, the GO sheet with a lower O/C composition of 0.32 showed a deviation from the linear fit (that is, 2D-VRH model) at all examined V ds and the temperature dependence of the s min at the higher temperature regime can be fitted reasonably well with the Arrhenius model, suggesting that thermally excited carriers begin to dominate electrical conduction 49 .…”
Section: Synthesis Of the Go Sheetsmentioning
confidence: 99%
“…In view of the above-described structural measurements, that is, HR-TEM and Raman results of the GO, hopping presumably occurs between the intact graphitic grains, which are separated by clusters of atomic defects. The deviation from linear fit at the lower temperautre regime can be explained by the contribution of the field-driven conduction without thermal activation [46][47][48] . However, the GO sheet with a lower O/C composition of 0.32 showed a deviation from the linear fit (that is, 2D-VRH model) at all examined V ds and the temperature dependence of the s min at the higher temperature regime can be fitted reasonably well with the Arrhenius model, suggesting that thermally excited carriers begin to dominate electrical conduction 49 .…”
Section: Synthesis Of the Go Sheetsmentioning
confidence: 99%
“…28,29 As the applied electric field approaches zero, approaches a constant value which depends on the temperature, i.e., the Ohmic regime is entered. In the opposite case, as the electric field is increased, deviations from Ohmic behavior become apparent and one expects an increase in when the energy associated with the electric field times a typical hopping distance becomes of the same order as the typical intersite energy difference.…”
Section: B Electric Field Dependencementioning
confidence: 99%
“…At somewhat higher fields, this term becomes irrelevant, and under typical experimental conditions, Eq. ͑4͒ converges to [29][30][31][32] ʈ ͑F,T͒ = 0,ʈ ͑0,T͒expͩ0.17…”
Section: Lateral Directionmentioning
confidence: 99%
“…Σύμφωνα με θεωρητικές μελέτες της κινητικής των φορέων σε ανομοιογενή συστήματα [51], [52], [53], [54], [55], [56], όπως είναι τα άμορφα διηλεκτρικά, ο ρυθμός μετάβασης ν ενός φορέα από μια Σχήμα 2.6: Φραγμός δυναμικού κατά την εκπομπή ενός ηλεκτρονίου από βαθιά ενεργειακή στάθμη υπό την επίδραση εξωτερικού ηλεκτρικού πεδίου: a) για φορτισμένη ατέλεια και b) για ηλεκτρικά ουδέτερη ατέλεια [50].…”
Section: μηχανισμός Hoppingunclassified
“…Σύμφωνα με τη θεωρία διέλευσης (percolation theory) και λαμβάνοντας υπόψη την επίδραση του τοπικού χημικού δυναμικού βρέθηκε ότι για ηλεκτρικά πεδία ℰ μέσης έντασης, για τα οποία ικανοποιείται η σχέση qℰrm>kT, η αγωγιμότητα hopping δίνεται από τη σχέση [56]: 27) όπου G(0) είναι η αγωγιμότητα σε μηδενικό ηλεκτρικό πεδίο, rm είναι η μέγιστη απόσταση ενός άλματος, l = Crm είναι το μήκος του άλματος και η …”
unclassified