2013
DOI: 10.1063/1.4809530
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A physical model of switching dynamics in tantalum oxide memristive devices

Abstract: We present resistive switching model for TaOx memristors, which demonstrates that the radius of a tantalum rich conducting filament is the state variable controlling resistance. The model tracks the flux of individual oxygen ions and permits the derivation and solving of dynamical and static state equations. Model predictions for ON/OFF switching were tested experimentally with TaOx devices and shown to be in close quantitative agreement, including the experimentally observed transition from linear to non-line… Show more

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Cited by 73 publications
(44 citation statements)
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“…Similar concepts such as bistable switching and voltage-controlled resistance phenomenon were also reported in a variety of oxides such as ZnO4, Al 2 O 3 5, TiO 2 6, Nb 2 O 5 78, and tantalum oxide910. Furthermore, this multistate switching phenomenon was also found in perovskite and chemical modified polymer, namely various tunable modes of the electronic conducting states11121314.…”
supporting
confidence: 74%
“…Similar concepts such as bistable switching and voltage-controlled resistance phenomenon were also reported in a variety of oxides such as ZnO4, Al 2 O 3 5, TiO 2 6, Nb 2 O 5 78, and tantalum oxide910. Furthermore, this multistate switching phenomenon was also found in perovskite and chemical modified polymer, namely various tunable modes of the electronic conducting states11121314.…”
supporting
confidence: 74%
“…[16,29,31,33,50,80] Depending on the different types of ReRAM cells, nucleation, [27,38,70,[81][82][83] charge transfer [71,84] or ion drift [85] were reported to be rate-limiting. The origin of the rate-limiting step however, cannot be unified because of its dependence on the nature of the solid electrolyte, on the electrode material(s) and on the thermodynamic factors.…”
Section: Kinetics Of Filament Formationmentioning
confidence: 99%
“…Our next effort is a theoretical study in collaboration with Dept. 1748 and Hewlett Packard on tantalum oxide based memristors and the impact of the filament geometry on the switching dynamics [29]. This study also includes experimental data on HP-fabricated devices that comports with our theoretical model of oxygen vacancy flux within devices.…”
Section: History Of Neuromorphic and Analog-like Microelectronic Devicesmentioning
confidence: 99%
“…This work was published in Applied Physics Letters in 2013 and the article material is included here [29]. Memristive systems, which display hysteretic I-V relationships based on tunable internal state variables, were originally observed and predicted as many as 40 years ago [58,60,61,79], but have recently become a field of intense research [52,55,56,77].…”
Section: A Physical Model Of Switching Dynamics In Tantalum Oxide Memmentioning
confidence: 99%