2018
DOI: 10.3390/s18124209
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A Polarization Independent Quasi-TEM Metamaterial Absorber for X and Ku Band Sensing Applications

Abstract: In this paper, a dual-band metamaterial absorber (MMA) ring with a mirror reflexed C-shape is introduced for X and Ku band sensing applications. The proposed metamaterial consists of two square ring resonators and a mirror reflexed C-shape, which reveals two distinctive absorption bands in the electromagnetic wave spectrum. The mechanism of the two-band absorber particularly demonstrates two resonance frequencies and absorption was analyzed using a quasi-TEM field distribution. The absorption can be tunable by… Show more

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Cited by 96 publications
(54 citation statements)
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“…The following sections illustrate the resonator magnetic field variation as a change of a valid parameter. In this paper, the dielectric properties ( ε , μ) of the microstructure resonator are derived from the traditional procedure of obtaining material parameters from transmission/reflection (TR) data 20 , 21 . However, the substrate dielectric property and patch structure equivalent LC tank circuit both affect the complex permeability as well as the complex permittivity.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The following sections illustrate the resonator magnetic field variation as a change of a valid parameter. In this paper, the dielectric properties ( ε , μ) of the microstructure resonator are derived from the traditional procedure of obtaining material parameters from transmission/reflection (TR) data 20 , 21 . However, the substrate dielectric property and patch structure equivalent LC tank circuit both affect the complex permeability as well as the complex permittivity.…”
Section: Resultsmentioning
confidence: 99%
“…The relationship from E.J. Rothwell was used in the Nicolson-Ross-Weir (NRW) method to calculate the refractive index 20
Figure 6 Reflection, transmission, and dielectric properties of MRMA in simulation ( a ) reflection characteristics, ( b ) transmission characteristics, ( c ) reflection versus transmission (real part) in simulation (CST, ADS software) and measured results, ( d ) relative permittivity ( e ) relative permeability and ( f ) refractive index using the Direct Refractive Index (DRI) method.
…”
Section: Resultsmentioning
confidence: 99%
“…here, ε 0 represents free space, and ε r is relative permittivity, the area of the split is A , and d stands for the split length which is “ g ” in the proposed structure. The equivalent inductance is calculated according to the transmission line principle mentioned in literature 51 .where, l = length of microstrip line, w = width of microstrip line, t = thickness of microstrip line, correction factor = Kg = 0.57–0.145 ln means the thickness of the substrate and h ′ means the width of the substrate. Both the external and internal inductance must be considered to determine the total inductance.…”
Section: Imaging System Setupmentioning
confidence: 99%
“…Negative values of ε and µ permit the energy and phase velocity of a wave to propagate in an inverse direction in the medium, thus resulting in a negative reflective index and forming left-handed material [1]. Leveraging the features of MMs, it has been investigated for different frequency ranges, i.e., GHz, THz and optical an frequency regime for most advance applications, such as sensing [2][3][4][5][6][7], satellite communication [8,9], invisibility cloaking [10,11], super lensing [12,13] and microwave-imaging [14]. Landy et al [15] first exploited the unique characteristics of MMs, and introduced the first metamaterial perfect absorber (MMPA).…”
Section: Introductionmentioning
confidence: 99%