The demands for data converters have soared in the last decade with the boom in consumer electronics, smart devices, autonomous vehicles, and automotive segments. The current trend among Nyquist-rate data converters, for example successive approximation register (SAR) analog-to-digital converters (ADC), tends towards high speeds and medium-to-high resolution. Applications such as vehicleto-everything (V2X) communication, wireless internet of things, test systems, etc., benefit from high-speed and high resolution ADCs. An in-depth analysis of data converter trends, and current state-of-the-art SAR ADCs are discussed. The topics discussed include data converters using binary and non-binary redundancy techniques, digital error correction schemes, DAC switching schemes, and associated hardware overheads. This thesis focuses on six important contributions to high speed and medium resolution SAR ADC research. The first one is the introduction of binary-scaled redundancy embedded in the conventional capacitive DAC (CDAC), and the second is optimizing the use of redundancy by introducing a new CDAC switching scheme. The third contribution introduces a simple "bit overlap and add" digital error correction-technique for a 10-bit SAR ADC. Multiple erroneous decisions can be corrected over nine conversion cycles, independent of where the erroneous conversion cycle occurred. The implementation of the technique requires no additional conversion cycles to obtain a 10-bit resolution. Fourth, this thesis introduces a new area-efficient switching scheme for a multi-bit per cycle SAR ADC. The proposed constant common-mode fractional reference voltage (CCM