A preliminary analysis of the surface chemistry of atmospheric aerosol particles in a typical urban area of Beijing

ToF‐SIMS characterization of microplastics in soils

“…In the particle size distribution of microplastics (Figure ), the proportion of microplastics with different particle size ranges in the three samples was in the order of 10 to 15 μm > 20 to 25 μm > 15 to 20 μm > 5 to 10 μm = 0 to 5 μm. With the increase in the particle size, the content of microplastics in the three samples first increased and then decreased, which is inconsistent with the results of most studies involving the increase of microplastic particle size . This may be because the microplastic particle size distribution in other studies is generally larger than 50 μm, while the particle size of microplastics in this study was smaller.…”

“…With the increase in the particle size, the content of microplastics in the three samples first increased and then decreased, which is inconsistent with the results of most studies involving the increase of microplastic particle size. [32][33][34][35][36] This may be because the microplastic particle size distribution in other studies is generally larger than 50 μm, while the particle size of microplastics in this study was smaller. The results indicate that the plastic waste in the soil is under the external influence of high temperature oxidation, ultraviolet radiation, physical erosion, and so on.…”

Tof-Sims Fragment Pattern Analysis Of Boron-Doped Chemical Vapour Deposition Diamond

“…While it is possible that CxHyfragments may have originated from the CVD diamond due to a copious amount of hydrogen in the CVD environment during the fabrication process (Saw et al, 2003;Saw & du Plessis, 2005), we attribute them to adventitious hydrocarbons on the sample surface. The SO3peak at m/z = 79.9570 as well as the Cl -, CN -, CNOand several CxHyOz fragments are attributed to atmospheric aerosol particles on the sample surface (Zhang et al, 2016;Zhu, Olson, & Beebe, 2001). Preliminary XPS investigations on similar as-received boron-doped CVD diamond samples show peaks belonging to S 2p and S 2s, N 1s as well as O 1s that are likely to have originated from adventitious hydrocarbons, carbonates or other atmospheric contaminants.…”

“…It can distinguish ions of elements with low atomic numbers (Z < 11) as well as their isotopes with high sensitivity (Zhang et al, 2016). It is therefore a suitable technique to analyse light element dopants such as boron (Z=5) as it is more sensitive technique than x-ray photoelectron spectroscopy (XPS) or energy dispersive spectroscopy (EDS).…”

Effects of pretreatment temperature on the analysis of size‐fractionated aerosol particles using ToF‐SIMS

“…During the past decades, the surface compositions of aerosol particles have been directly studied using several analysis techniques such as scanning electron microscopy combined with energy dispersive X-ray spectroscopy (SEM-EDX), 7 X-ray photoelectron spectroscopy (XPS), [7][8][9] time-of-flight secondary ion mass spectrometry (ToF-SIMS), [9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25] and near-edge X-ray adsorption fine structure (NEXAFS) spectroscopy. 26 Among these techniques, ToF-SIMS has been widely used to investigate the surface composition of aerosol particles in order to locate their emission sources and predict their potential impacts on human health and environment.…”