1969
DOI: 10.1107/s0021889869006558
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A profile refinement method for nuclear and magnetic structures

Abstract: A structure refinement method is described which does not use integrated neutron powder intensities, single or overlapping, but employs directly the profile intensities obtained from step‐scanning measurements of the powder diagram. Nuclear as well as magnetic structures can be refined, the latter only when their magnetic unit cell is equal to, or a multiple of, the nuclear cell. The least‐squares refinement procedure allows, with a simple code, the introduction of linear or quadratic constraints between the p… Show more

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Cited by 16,287 publications
(8,427 citation statements)
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References 5 publications
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“…The diffraction patterns were recorded through the range of 2θ angles between 10° and 100° in steps of 0.01°. The phases present in the sintered samples were identified from the quantitative analyses of the XRD patterns using the Rietveld method, the FULLPROF software, and the crystallographic data from the reference JCPDS files [32,33]. Lattice parameters of hexagonal structure were calculated using the reflections of the most intense peaks from HA and HA10Y XRD patterns.…”
Section: Methodsmentioning
confidence: 99%
“…The diffraction patterns were recorded through the range of 2θ angles between 10° and 100° in steps of 0.01°. The phases present in the sintered samples were identified from the quantitative analyses of the XRD patterns using the Rietveld method, the FULLPROF software, and the crystallographic data from the reference JCPDS files [32,33]. Lattice parameters of hexagonal structure were calculated using the reflections of the most intense peaks from HA and HA10Y XRD patterns.…”
Section: Methodsmentioning
confidence: 99%
“…The minerals were identified by reference to the ICDD Powder Diffraction File. Quantitative analysis of mineral abundance was carried out using the Siroquant™ processing software (Taylor, 1991), based on the principles developed by Rietveld (1969), using procedures discussed further by Ward et al (1999).…”
Section: Analytical Proceduresmentioning
confidence: 99%
“…Data were collected in steps of 0.028-2-Theta with total data collection times of 24 h to collect 8 diffractograms from 38 to 538 2-Theta which were then averaged. The diffractograms were evaluated with the Rietveld profile fitting method [36]. The diffraction intensities were calculated on the basis of the crystal structure data of monoclinic hydroxyapatite [37] and the silicon standard.…”
Section: Mineral Analyses: X-ray Diffractionmentioning
confidence: 99%