A proof-of-principle experiment on a new diagnostic tool for determining beam sizes from angular distributions of parametric X-ray radiation

Use of parametric X-ray radiation of electrons in crystals to determine the parameters of imaging-plates

“…Therefore, it turned out to be more convenient to compare the vertical distributions, especially because the photon energy does not depend on 𝜃 𝑦 for a fixed value of 𝜃 𝑥 [5].…”

“…The divergence of the electron beam was 𝜃 ′ 𝑥 ∼ 0.1 mrad and 𝜃 ′ 𝑦 ∼ 0.1 mrad. The horizontal and vertical dimensions of the electron beam are 𝜎 𝑥 ≈ 0.3 mm and 𝜎 𝑦 ≈ 1.3 mm [5]. We assumed that the angular and spatial distributions of the beam are described by two-dimensional Gaussian distributions with standard deviations 𝜃 ′ 𝑥 , 𝜃 ′ 𝑦 and 𝜎 𝑥 , 𝜎 𝑦 .…”

“…The details of the experimental setup are described elsewhere [5,16]. The Si crystal was mounted onto a two-dimensional goniometer in a vacuum chamber.…”

“…It is generally accepted that for this it is enough to take into account the first three allowed orders of reflection, since, the contribution of higher orders is usually negligible. In addition, it is necessary to take into account the dimensions of the electron beam on the crystal and the distance between the crystal and the plate [5].…”

“…Interest in PXR stems mainly from the search for new sources of intense X-ray radiation with tunable wavelengths, as alternatives to storage rings. Advantages such as monochromaticity, the possibility of smooth adjustment in energy by changing the orientation of the crystal and the observation angle, a large emission angle relative to the direction of incidence of electrons on the crystal (and, as a consequence, a low background level), and good agreement between the measurement and calculation results [2] enable PXR to be applied to problems such as calibrating X-ray space telescopes [3] and measuring the transverse dimensions of electron beams [4,5], among others.…”