A proposal of new contactless layered sensor for material identification

Kimoto, Akira; Fujisaki, Shintarou; Shida, Katsunori

doi:10.1016/j.sna.2008.09.015

Cited by 8 publications

(2 citation statements)

References 15 publications

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“…At this time, the machine direction of the PVDF film was along the length direction of the half-pipe, that is, not the curved direction. Indium tin oxide (ITO) layers were used as transparent conductive electrodes on the PVDF films for the photo-sensor [16]. The surface resistance of the PVDF film was approximately 150 sq −1 .…”

Section: Sensor Structure and Experimental Methodsmentioning

confidence: 99%

A new sensing method based on PVDF film for material identification

Kimoto¹,

Sugitani²

2010

Meas. Sci. Technol.

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This paper proposes a new sensing method based on polyvinylidene fluoride (PVDF) film for material identification. The proposed method makes it possible that the voltages (contact voltages) induced by the piezoelectric and electrostatic effects at the contact between the PVDF film and the material are simultaneously measured. The material identification including the hardness is possible by using their voltages. In the experiment, the identification of ten kinds of materials including hardness was demonstrated by the simultaneous measurement of the voltages. The results indicate that it is possible to simultaneously measure the contact voltages, although there are still some problems that should be solved.

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Section: Sensor Structure and Experimental Methodsmentioning

confidence: 99%

A new sensing method based on PVDF film for material identification

Kimoto¹,

Sugitani²

2010

Meas. Sci. Technol.

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“…That is, while optical sensors are not able to penetrate deep into opaque samples, the eddy current sensor cannot efficiently probe dielectric materials in its proximity. Previous studies have shown that optical reflectance probes can be successfully combined with capacitance [22,23] and eddy current measurements [24]. However, we are not aware of any studies wherein optical spectroscopy is combined with eddy current sensing in one sensor.…”

Section: Introductionmentioning

confidence: 98%

Optical fibre spectrometer combined with a magnetic resonance sensor for multiple depth monitoring

Helseth

2013

Meas. Sci. Technol.

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Under some circumstances, it is necessary to do optical spectroscopy on a front surface while at the same time monitoring the presence of a hidden metallic layer. Here, a novel sensor system to do this based on the combination of a visible light optical fibre spectrometer with a magnetic resonance eddy current sensor is demonstrated. It is shown that the the eddy current sensor can probe a hidden metallic film placed up to 1 cm behind the dielectric front surface. The combination of two such detection principles allows one to probe layered materials at multiple depths, revealing their electromagnetic properties at different frequencies.

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