Cr-doped GaN films were epitaxially grown on Si(111) substrates by molecular-beam epitaxy using NH3 as a nitrogen source, and the magnetic and magneto-optical properties of the films were measured. Magnetic measurements using a superconducting quantum interference device (SQUID) magnetometer revealed that the Cr-doped GaN films showed ferromagnetic behavior at 5 K. However, magnetic circular dichroism (MCD) measurements revealed that the observed ferromagnetism could not be attributed to the Cr-doped GaN itself, but to unidentified ferromagnetic precipitates in the grown layers.