2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) 2017
DOI: 10.1109/ieem.2017.8290163
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A random forest method for obsolescence forecasting

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Cited by 8 publications
(4 citation statements)
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“…It is a supervised method that can handle both regression (problems with continuous dependent variables) and classification (problems with categorical dependent variables) tasks. The core concept of the method is to integrate many decision trees to decide the final output rather than depending on individual decision trees, which reduces model variance [23]- [26]. Random forest constructs numerous versions of These tree predictions are combined with a majority vote to get the final projection.…”
Section: Random Forest Modelmentioning
confidence: 99%
“…It is a supervised method that can handle both regression (problems with continuous dependent variables) and classification (problems with categorical dependent variables) tasks. The core concept of the method is to integrate many decision trees to decide the final output rather than depending on individual decision trees, which reduces model variance [23]- [26]. Random forest constructs numerous versions of These tree predictions are combined with a majority vote to get the final projection.…”
Section: Random Forest Modelmentioning
confidence: 99%
“…Among them, Jennings et al [ 3 ] tested the effectiveness of random forest (RF), neural network, and support vector machine algorithms for obsolescence risk and life-cycle forecasting. Grichi et al [ 12 ] used the RF method for obsolescence forecasting and improved it by combining it with a genetic algorithm [ 13 ]. The limited success of ML or DL methods for obsolescence prediction can be attributed to the scarcity of available data.…”
Section: Introductionmentioning
confidence: 99%
“…(RF: random forest, NN: neural network, SVM: support vector machine, LR: logistic regression, GB: gradient boosting, GA: genetic algorithm, DT: decision tree, DNN: deep neural network, RNN: recurrent neural network). Category Authors (Year) Application (Target) Method Mathematical Solomon et al (2000) [ 4 ] Integrated circuits (years to obsolescence) Gaussian distribution models Sandborn et al (2007) [ 5 ] Flash memory/DRAM (life cycle curve) Curve fitting Sandborn et al (2011) [ 7 ] Electronic parts (obsolescence dates) Linear regression Ma and Kim (2017) [ 8 ] Flash memory (life cycle curve) Time series model Trabelsi et al (2021) [ 2 ] Smartphones (obsolescence probability density) Statistical test Mastrangelo et al (2021) [ 9 ] Electronic parts (obsolescence probability) conditional probability method Machine Jennings et al (2016) [ 3 ] Cellphones (obsolescence dates) RF/NN/SVM learning Grichi et al (2017) [ 12 ] …”
Section: Introductionmentioning
confidence: 99%
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