Abstract:In this paper, a random jitter (RJ) extraction technique in the presence of sinusoidal jitter (SJ) is proposed for onchip jitter tolerance testing applications. First, the periodtracking technique [4] is utilized to derive the SJ frequency and amplitude information. Then, using the same designfor-test (DfT) circuitry, samples from the total jitter cumulative distribution function (CDF) are taken. From the SJ information and CDF samples, a binary search method is utilized to obtain the RJ sigma value. The feat… Show more
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