2016
DOI: 10.1016/j.matlet.2016.04.082
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A rapid FIB-notch technique for characterizing the internal morphology of high-performance fibers

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Cited by 21 publications
(24 citation statements)
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“…This creates a flat interior surface of the fiber, with minimal damage to fiber meso/nanostructure on which experiments may be performed. Stockdale et al discuss the details of the experimental technique as well as a detailed look at the preserved microstructure in the shear plane in their article.…”
Section: Methodsmentioning
confidence: 99%
“…This creates a flat interior surface of the fiber, with minimal damage to fiber meso/nanostructure on which experiments may be performed. Stockdale et al discuss the details of the experimental technique as well as a detailed look at the preserved microstructure in the shear plane in their article.…”
Section: Methodsmentioning
confidence: 99%
“…In order to prepare the samples for these morphology studies, a novel FIB-notch technique was employed which has been detailed elsewhere [ 14 ]. Once the FIB-notch technique is used to expose an internal surface for scanning, the samples are mounted on a double-sided adhesive for AFM imaging.…”
Section: Methodsmentioning
confidence: 99%
“…Direct SEM is not particularly effective on nonconducting high-performance fibers like UHMWPE and Kevlar; a metal coating must be applied to the fibers to prevent melting by the electron beam, and the technique only reports topographical information. Finally, TEM, while able to provide spatial crystalline orientation, requires microtoming specimens to thicknesses of tens of nanometers which is difficult and potentially alters the microstructure due to violent cross sectioning [ 14 ].…”
Section: Introductionmentioning
confidence: 99%
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“…4 show the amplitude versus distance and the phase versus distance spectra, respectively. These are shown for both the spin-cast PS (Bruker) and the UHMWPE (prepared using a focused-ion-beam notching technique) [4]. What should be noted from these plots is the region of operation for the multi-frequency technique, in specific, the bottom region of the first mode amplitude plot is the imaging amplitude setpoint (1 V).…”
Section: Experimental Design Materials and Methodsmentioning
confidence: 99%