Abstract:This paper reports a readout system for a piezoresistive accelerometer which is fabricated by LTCC thick-film process technology. The authors first introduce a LTCC compatible design of this new kind of accelerometer, which is based on piezoresistive phenomenon. As the performance of the accelerometer circuitry is affected by temperature, a readout system is introduced for compensating the temperature drift and the non-linearity of this piezoresistive accelerometer by using the MAX1452 processor. The authors g… Show more
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