Frequency‐controlled metasurfaces have attracted significant attention for a variety of applications, such as radar imaging and 5G communication, owing to their small size and low cost. However, due to the inherent material dispersion of these devices, bandwidth is an essential requirement for their controlling their wavefront. To evaluate the broadband performance of frequency‐controlled metasurface focusing systems, a multiresonant model is used to achieve controlled manipulation of frequency‐splitting and focusing reflective metasurface; further, the transition from broadband disorder scattering to user‐desired reflection is obtained. It is shown that the focusing position can be controlled by the careful design of each unit cell. As a proof of concept, a broadband focusing metasurface with frequency‐splitting effect over the entire X band, i.e., 8–12 GHz, is designed and experimentally demonstrated, which can control the position of focal spots with different wavelengths by its achromatic and reflective characteristics. It is believed that the proposed metasurface will provide useful insights for wavefront manipulation in broadband and chromatically corrected imaging systems.