A reconstruction method of AFM tip by using 2 µm lattice sample

Zhang, Xiaodong; Zhao, Lin; Han, Zhiguo; Xu, Xiaoqing; Li, Suoyin; Wu, Aihua

doi:10.1007/s11801-022-2009-6

Cited by 3 publications

(2 citation statements)

References 8 publications

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“…They conducted tip shape analysis using AFM images centered on a single nanoparticle on a flat substrate to investigate the critical size of the reconstructed nanoparticle. Zhang et al [ 16 ] developed a 2 µm lattice sample with uniformity and consistency to reconstruct the AFM tip, thus mitigating the impact of tip effects on measurement results. Onishi et al [ 17 ] proposed a technique to extract the probe shape function from AFM topography images of standard nanoscale spherical particles and rectangular parallelepiped nanostructures of known shapes and to quantitatively estimate the shape of the tip by measuring the known nanostructures in advance.…”

Section: Introductionmentioning

confidence: 99%

Quantitative wear evaluation of tips based on sharp structures

Xu,

Leng

2024

Beilstein J. Nanotechnol.

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To comprehensively study the influence of atomic force microscopy (AFM) scanning parameters on tip wear, a tip wear assessment method based on sharp structures is proposed. This research explored the wear of AFM tips during tapping mode and examined the effects of scanning parameters on estimated tip diameter and surface roughness. The experiment results show that the non-destructive method for measuring tip morphology is highly repeatable. Additionally, a set of principles for optimizing scanning parameters has been proposed. These principles consider both scanning precision and tip wear. To achieve these results, an AFM probe was used to scan sharp structures, precisely acquiring the tip morphology. Tip wear was minimized by employing lower scanning frequency and free amplitude, and a set point of approximately 0.2, resulting in clear, high-quality AFM images.

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Section: Introductionmentioning

confidence: 99%

Quantitative wear evaluation of tips based on sharp structures

Xu,

Leng

2024

Beilstein J. Nanotechnol.

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“…This phenomenon is referred to as tip convolution, and the process of determining the actual dimensions of surface objects is known as tip deconvolution [51][52][53][54]. It is worth noting that special attention has been given for the accurate topographical characterization of nanosized materials [55][56][57][58] and cylindrical-shaped samples due to the applications related to nanofibrils [59].…”

Section: Introductionmentioning

confidence: 99%

Overcoming Challenges and Limitations Regarding the Atomic Force Microscopy Imaging and Mechanical Characterization of Nanofibers

Kontomaris,

Stylianou,

Chliveros

et al. 2023

Fibers

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Atomic force microscopy (AFM) is a powerful tool that enables imaging and nanomechanical properties characterization of biological materials. Nanofibers are the structural units of many biological systems and their role in the development of advanced biomaterials is crucial. AFM methods have proven to be effective towards the characterization of fibers with respect to biological and bioengineering applications at the nanoscale. However, both the topographical and mechanical properties’ nanocharacterizations of single fibers using AFM are challenging procedures. In particular, regarding imaging procedures, significant artifacts may arise from tip convolution effects. The geometrical characteristics of the AFM tip and the nanofibers, and the fact that they have similar magnitudes, may lead to significant errors regarding the topographical imaging. In addition, the determination of the mechanical properties of nanofibers is also challenging due to their small dimensions and heterogeneity (i.e., the elastic half-space assumption is not valid in most cases). This review elucidates the origins of errors in characterizing individual nanofibers, while also providing strategies to address limitations in experimental procedures and data processing.

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