2017
DOI: 10.1039/c7cp06948k
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A relationship between the force curve measured by atomic force microscopy in an ionic liquid and its density distribution on a substrate

Abstract: An ionic liquid forms a characteristic solvation structure on a substrate. For example, when the surface of the substrate is negatively or positively charged, cation and anion layers are alternately aligned on the surface. Such a solvation structure is closely related to slow diffusion, high electric capacity, and chemical reactions at the interface. To analyze the periodicity of the solvation structure, atomic force microscopy is often used. The measured force curve is generally oscillatory and its characteri… Show more

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Cited by 24 publications
(25 citation statements)
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“…These jumps are strongly dependent on the charging of the system. In the case that the tip or surface is not charged, the measured thicknesses of the layers correspond to the dimension of the anion or cation, respectively, but when a charged surface is investigated with a charged tip, the observed jumps correlate with the dimension of an ion pair [81]. In this manner, detailed information about mechanical properties and the thicknesses of the interface layers of ionic liquids can be collected with sub-nN and sub-nm resolution.…”
Section: Principles Of Atomic Force Spectroscopymentioning
confidence: 99%
“…These jumps are strongly dependent on the charging of the system. In the case that the tip or surface is not charged, the measured thicknesses of the layers correspond to the dimension of the anion or cation, respectively, but when a charged surface is investigated with a charged tip, the observed jumps correlate with the dimension of an ion pair [81]. In this manner, detailed information about mechanical properties and the thicknesses of the interface layers of ionic liquids can be collected with sub-nN and sub-nm resolution.…”
Section: Principles Of Atomic Force Spectroscopymentioning
confidence: 99%
“…3,4 At the solid interface of ILs, the ionic multilayer structure has been revealed by an atomic force microscopy (AFM). [5][6][7][8] When the solid substrate is highly charged, the ionic multilayers consist of alternating layers of cations and anions as found by molecular dynamics (MD) simulations, 9,10 theories, 11,12 and X-ray reflectometry. 10,13 Using MD simulation, Ivaništšev et al showed 9,10 that the density oscillation of alternating layers increases as the electric double layer (EDL) is charged up, but a further charge up causes the attenuation of the oscillation.…”
Section: Introductionmentioning
confidence: 98%
“…These multiple peaks can be attributed to the surfactant molecules solvated on the surface in a fluid-like micelle, where the observation mechanism of the oscillatory peaks seems to be similar to that of room-temperature ionic liquids. 45 In our previous study, we already reported the observation of solvation layers inside the micelle, 28 but only two layers were observed. This result demonstrated that FM-AFM has an advantage of acquiring the solvation measurement over SM-AFM.…”
Section: Resultsmentioning
confidence: 95%
“…liquids. 45 In our previous study, we already reported the observation of solvation layers inside the micelle, 28 but only two layers were observed. This result demonstrated that FM-AFM has an advantage of acquiring the solvation measurement over SM-AFM.…”
Section: Disruption Process Of Micellesmentioning
confidence: 95%