A reliability test-plan for series systems with components having stochastic failure rates

Nair, Jayakrishnan; Sabnis, Sanjeev

doi:10.1109/24.994899

Cited by 7 publications

(3 citation statements)

References 11 publications

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“…They also use prior information available in the form of upper bounds on failure rates in their design and an integer optimization problem is formulated satisfying the usual probability requirements. Nair and Sabnis (2002) developed a reliability test plan for a series system by considering that the failure rate of the component follows a uniform distribution over an interval, while the underlying lifetime distribution is exponential. They have used Type-I censoring.…”

Section: Introductionmentioning

confidence: 99%

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Reliability test plan for a series system with variable failure rates

Bajeel

Kumar

2017

IJQRM

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Purpose This paper considers a series system consisting of n different components having unknown and variable failure rates, where the lifetime of components follow exponential distribution having non-constant failure rates. Moreover, the failure rates are bounded by above and are dependent on environmental factors such as temperature, pressure, through linear relationship. The purpose of this paper is to design a component reliability test plan for such a series system with an unknown variable failure rate. Design/methodology/approach The reliability of the system is estimated with the help of the unbiased estimator of failure rate. The testing procedure is stopped when a fixed number of failures occur for each component. Findings An optimal reliability test plan is designed and the resultant non-linear integer optimization problem is formulated satisfying the constraints of producer’s and consumer’s risks. The obtained results are compared with the results available in the literature. Some examples are considered to illustrate the approach. Originality/value It is observed that use of prior information in the form of an upper bound and incorporation of environmental factors have the advantage of savings in the total testing cost.

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Section: Introductionmentioning

confidence: 99%

“…Nair and Sabnis (2002) developed a reliability test plan for a series system by considering that the failure rate of the component follows a uniform distribution over an interval, while the underlying lifetime distribution is exponential. They have used Type-I censoring.…”

Section: Introductionmentioning

confidence: 99%

Reliability test plan for a series system with variable failure rates

Bajeel

Kumar

2017

IJQRM

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“…In most of the models available in the literature, R(λ) is the system reliability or the probability of system survival until a predetermined time. The reader is referred to Gal (1974), Mazumdar (1977Mazumdar ( , 1980, Easterling et al (1991), Altınel (1994), Altınel andÖzekici (1997), Altınel et al (2001), and Nair and Sabnis (2002) for such models and historical developments. In a recent work, Altınel et al (2011) deviate from this fixed time-based definition of reliability and define it as the probability that the whole mission, which consists of several non-overlapping phases, is successfully completed.…”

Section: Introductionmentioning

confidence: 99%

The design of mission-based component test plans for series connection of subsystems

Altınel

Çekyay

et al. 2013

IIE Transactions

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Çekyay, Bora (Dogus Author)This article analyzes the mission-based component testing problem of devices which consist of series connection of 1-out-of-n subsystems or series connection of m-out-of-n subsystems. The device is designed to perform a mission that has a random sequence of phases with random durations. It is assumed that the deterioration of the components of the system is modulated by the mission process in such a way that the component failure rates depend on the phase that is performed. The objective is to find optimal component test times that yield desired levels of system reliability. An algorithmic procedure that is based on a column generation technique and d.c. programming is presented. This procedure eventually solves a semi-infinite linear program and it is illustrated by numerical examples. The existence of optimal component test times is discussed and sufficient conditions for the feasibility of the underlying semi-infinite linear programming model are determined

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Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring

Bajeel¹,

Kumar

2020

Advances in Intelligent Systems and Computing

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A reliability test-plan for series systems with components having stochastic failure rates

Cited by 7 publications

References 11 publications

Reliability test plan for a series system with variable failure rates

Reliability test plan for a series system with variable failure rates

The design of mission-based component test plans for series connection of subsystems

Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring

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