A reliable profiled lightly doped drain (PLD) cell for high-density submicrometer EPROM's and flash EEPROM's

Yoshikawa, K.; Sato, Masaki; Ohshima, Y.

doi:10.1109/16.52435

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A reliable profiled lightly doped drain (PLD) cell for high-density submicrometer EPROM's and flash EEPROM's

Cited by 6 publications

References 7 publications

Modelling and simulation of reliability for design

Modelling and simulation of reliability for design

Comparison of characteristics of conventional and LDD short channel MOSFETs

Discretization Methods and Physical Models for Simulating Leakage Currents in Semiconductor Devices With Application to Modeling Trench‐dram Cells

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