1981
DOI: 10.1016/0026-2714(81)90398-x
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A reparable multistate device with arbitrarily distributed repair times

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1987
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Cited by 16 publications
(7 citation statements)
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“…In recent years, mathematical models governed by distributed parameter systems of coupled partial and ordinary hybrid equations have been widely used to study the reliability of reparable systems (cf. [3,6,8,9,10,11,12,23]). Reliability is defined as the probability that the system, subsystem or component will operate successfully by a given time t (cf.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, mathematical models governed by distributed parameter systems of coupled partial and ordinary hybrid equations have been widely used to study the reliability of reparable systems (cf. [3,6,8,9,10,11,12,23]). Reliability is defined as the probability that the system, subsystem or component will operate successfully by a given time t (cf.…”
Section: Introductionmentioning
confidence: 99%
“…Chung [1] developed the mathematical model of the device with arbitrarily distributed repair time by supplementary variable technique and discussed the steady-state solution. However, when the repair rate is time-dependent, the well-posedness and asymptotic stability of this system need to be proved strictly.…”
Section: Introductionmentioning
confidence: 99%
“…In this paper, we are dedicated to discussing the exponential stability of this device, which is significant for the robustness of the system. differential equations according to [1]:…”
Section: Introductionmentioning
confidence: 99%
“…By the method of probability analysis, the mathematical model associated with Figure 1 can be expressed as (see [7]) dp…”
Section: Device Formulationmentioning
confidence: 99%
“…But in many practical cases, the repair time of a failed device is arbitrarily distributed. Chung [7] extended the work of Elsayed and Zebib [6] and developed a mathematical model of the device with arbitrarily distributed repair time. Further, Chung [7] derived steady availability of the device by the method of inversion of the Laplace transform.…”
Section: Introductionmentioning
confidence: 99%