2021 IEEE International 3D Systems Integration Conference (3DIC) 2021
DOI: 10.1109/3dic52383.2021.9687615
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A Review of 3D-Dynamic Random-Access Memory based Near-Memory Computation

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Cited by 6 publications
(2 citation statements)
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“…switches are used to isolate the SA from the reference bitline and the precharge cir Though energy consumption in the precharge stage is inevitable, the voltage supply f the SA is not required to charge the BLB to VDD, thereby (VDD 2 Cb)/2 can be reduce the post-sense stage. Similarly, during a read '1′-write '0′ operation, there is no vol supply requirement for charging the BLB capacitance Cb from the write driver, resu in reduced VDD 2 Cb in the IO transition stage. The newly added switches can be contro by the least significant bit (LSB) of the row address line.…”
Section: Analysis Of the Single Bitline Load Sense Amplifiermentioning
confidence: 99%
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“…switches are used to isolate the SA from the reference bitline and the precharge cir Though energy consumption in the precharge stage is inevitable, the voltage supply f the SA is not required to charge the BLB to VDD, thereby (VDD 2 Cb)/2 can be reduce the post-sense stage. Similarly, during a read '1′-write '0′ operation, there is no vol supply requirement for charging the BLB capacitance Cb from the write driver, resu in reduced VDD 2 Cb in the IO transition stage. The newly added switches can be contro by the least significant bit (LSB) of the row address line.…”
Section: Analysis Of the Single Bitline Load Sense Amplifiermentioning
confidence: 99%
“…The volatile memory of static random access memory (SRAM) and dynamic random access memory (DRAM) are widely used in computing systems [1][2][3][4]. Scaling bulk CMOS SRAM technology for on-chip caches beyond the 22 nm node results in high leakage power consumption, performance degradation, and instability due to process variations [5,6].…”
Section: Introductionmentioning
confidence: 99%