“…Development of sensor devices with a structure that enables, to some extent, to control their metrological serviceability within the process of operation has been started in Russia since 1980s (Druzhinin & Kochugurov, 1988;Sapozhnikova, 1991;Sapozhnikova et al, 1988;Tarbeyev et al, 2007). Later on, such activity was also expanded in the UK and USA as well as in Germany, China and other countries (Barberree, 2003;Hans & Ricken, 2007;Henry & Clarke, 1993;Henry et al, 2000;Feng et al, 2007Feng et al, , 2009Reed, 2003;Werthschutzky & Muller, 2007;Werthschutzky & Werner, 2009). In general, the above works are of an heuristic character.…”