A Rule Based Human Skin Detection Method in CMYK Color Space

Sahnoune, Abdelkrim; Dahmani, Djamila; Aouat, Saliha

doi:10.1007/978-3-030-58861-8_17

“…Because the HSV color space model is highly accurate as the way humans perceive colors, it has been widely used in image processing and computer graphics applications since a few decades ago [3]. With the development of advanced algorithms and enhanced computational capabilities enabling fast, accurate, reliable color space conversion between the RGB and HSV models by using digital signal processors (DSPs), the HSV color space models have been used in various applications including human skin detection [4][5][6], face recognition [7], object tracking [8], defect detection [9,10], bio and health condition diagnosis [11,12], and particle color property identi cation [13,14].…”

Section: Introductionmentioning

confidence: 99%

Wafer Particle Inspection Technique Using Computer Vision based on Color Space Transform Model

Wang¹,

Chun²,

Kim³

et al. 2023

Preprint

0

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This paper introduces a computer vision technique for wafer particle metrology and inspection. Artificially generated particle images based on their color properties were used to verify HSV (hue, saturation, value) color space models of each particle and to demonstrate how the proposed method efficiently classifiesparticles by their types with minimum crosstalk. A high-resolution microscope consisting of an imaging system, illumination system, and spectrometer was developed for the experimental validation. The three kinds of micrometer-scale particles were randomly placed on the wafers and the images collected under the exposed white light illumination were analyzed and segmented by particle types based on pre-developed HSV color space models specified for each particle type. The proposed method is expected to inspect and classify various wafer particles in the defect binning process.

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“…Because the HSV color space model is highly accurate as the way humans perceive colors, it has been widely used in image processing and computer graphics applications since a few decades ago [3]. With the development of advanced algorithms and enhanced computational capabilities enabling fast, accurate, reliable color space conversion between the RGB and HSV models by using digital signal processors (DSPs), the HSV color space models have been used in various applications including human skin detection [4][5][6], face recognition [7], object tracking [8], defect detection [9,10], bio and health condition diagnosis [11,12], and particle color property identi cation [13,14].…”

Section: Introductionmentioning

confidence: 99%

Wafer particle inspection technique using computer vision based on a color space transform model

Chun

¹

,

Wang

²

,

Kim

³

et al. 2023

Int J Adv Manuf Technol

4

0

View full text Add to dashboard Cite

This paper introduces a computer vision technique for wafer particle metrology and inspection. Arti cially generated particle images based on their color properties were used to verify HSV (hue, saturation, value) color space models of each particle and to demonstrate how the proposed method e ciently classi esparticles by their types with minimum crosstalk. A high-resolution microscope consisting of an imaging system, illumination system, and spectrometer was developed for the experimental validation. The three kinds of micrometer-scale particles were randomly placed on the wafers and the images collected under the exposed white light illumination were analyzed and segmented by particle types based on pre-developed HSV color space models speci ed for each particle type. The proposed method is expected to inspect and classify various wafer particles in the defect binning process.

show abstract

Enhanced Hybrid Skin Detection Method Using Multiple 3D Volumes and Threshold Optimization

Sahnoune,

Dahmani,

Aouat

2024

Lecture Notes in Networks and Systems

0

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A Rule Based Human Skin Detection Method in CMYK Color Space

Cited by 4 publications

References 12 publications

Wafer Particle Inspection Technique Using Computer Vision based on Color Space Transform Model

Wafer Particle Inspection Technique Using Computer Vision based on Color Space Transform Model

Wafer particle inspection technique using computer vision based on a color space transform model

Enhanced Hybrid Skin Detection Method Using Multiple 3D Volumes and Threshold Optimization

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