2024
DOI: 10.3390/jlpea14010005
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A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits

Dipayan Mazumder,
Mithun Datta,
Alexander C. Bodoh
et al.

Abstract: The increasing demand for high-speed, energy-efficient, and miniaturized electronics has led to significant challenges and compromises in the domain of conventional clock-based digital designs, most notably reduced circuit reliability, particularly in mission-critical hardware. At scaled technology nodes, devices are vulnerable to transient or soft errors, such as Single Event Upset (SEU) and Single Event Latch-up (SEL). External radiation, internal electromagnetic interference (EMI), or noise are the primary … Show more

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