“…For controlling tip–sample separation, several displacement detection methods have been applied to scanning near‐field optical microscopy (SNOM). Typically, scanning tunnelling microscopy (STM) (Dürig et al ., 1986), photon scanning microscopy (PSTM) (Reddick et al ., 1989), beam deflection (an optical lever) (Betzig et al ., 1992; Shalom et al ., 1992; van Hulst et al ., 1993; Muramatsu et al ., 1995) and piezoelectric detection (Karrai & Grober, 1995; Muramatsu et al ., 1997) methods are used for this purpose. In these methods, the STM method is reliable, but it can work only for conductive samples.…”