A sensitive device for the measurement of the force exerted by the arc on the electrodes

Chabrerie, J.P.; Devautour, J.; Gouega, A.M.; Testé, Philippe

doi:10.1109/95.390311

Cited by 7 publications

(3 citation statements)

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“…Practical No matter which of the above processes introduces the dominating retarding component among the contacting joints, it is a fact that highly injecting mechanically contacted metals are electrostatically repelled [14]. This phenomenon occasionally becomes noticeable in the external circuit provided the metallic joints are weakly attached.…”

Section: Measurements Across Highly Injecting Stationary Metal Contacmentioning

confidence: 99%

“…Another implication possibly rising by the ion layer formation is the electrostatic repulsion, which has been reported to occur at least for the case of arcing metal-metal contacts [14]. Practical No matter which of the above processes introduces the dominating retarding component among the contacting joints, it is a fact that highly injecting mechanically contacted metals are electrostatically repelled [14].…”

Section: Measurements Across Highly Injecting Stationary Metal Contacmentioning

confidence: 99%

“…Zografou, Athens, Greece (Received 10 November 1994; Revised 14 May 1996; In final form 17 June 1996) This paper is an experimental investigation of the major implications brought in the crossing resistance of mechanically contacted metals when operating in the high electronic injection regime, i.e., steady state interfacial voltage values greater than the max. acceptable level determined by specifications and less than the melting voltage.…”

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confidence: 99%

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Electrostatic Repulsion Between Highly Injecting Metals: An Experimental Investigation

Dervos

1996

Active and Passive Electronic Components

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This paper is an experimental investigation of the major implications brought in the crossing resistance of mechanically contacted metals when operating in the high electronic injection regime, i.e., steady state interfacial voltage values greater than the max. acceptable level determined by specifications and less than the melting voltage. Under such operating conditions, monolayers of positive ions may be formed within interfacial cavities filled by the material from the surrounding space. The dominating ion neutralization process on the cathode controls the formation of "Helmholtz" inner layers at the metal cathode+oxide+gas interface. The presence of a positive ion monolayer over the cathode electrode will tend to reduce the field threshold required for electronic field emission and affect the overall currentvoltage characteristics.The response of contacts operating under high charge injection is monitored on an injected charge vs. interfacial field phase space, which clearly demonstrates non-linear conductivity phenomena and hysteresis effects for the examined structures. Experimental results indicate convincingly the importance of the dielectric media around highly injecting metal contacts. The excessive positive ion formation may also account for the experimentally observed electrostatic repulsion between highly injecting metal contacts. Under low contact pressure situations spontaneous separation of the current carying electrodes may occur. During a spontaneous contact breaking process, the transient current and voltage profiles across the metal contacts have been monitored using state-of-the-art data logging systems. The importance of the oxide capacitance and (time varying) gap capacitance on V(t) and I(t) profiles has been discussed. The obtained results provide evidence for the positive ion layer formation over the cathode electrodes.

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Section: Measurements Across Highly Injecting Stationary Metal Contacmentioning

confidence: 99%

Section: Measurements Across Highly Injecting Stationary Metal Contacmentioning

confidence: 99%

mentioning

confidence: 99%

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