2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era 2008
DOI: 10.1109/dtis.2008.4540243
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A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMs

Abstract: This paper focuses on diagnosis of dynamic faults in SRAMs. The current techniques for fault diagnosis are mainly based on the signature method. Here, we introduce an extension of the signature scheme by taking in account additional information related to the addressing order during March test execution. A first advantage of the proposed approach is its capability to distinguish between static and dynamic faults. Another main feature is the correct identification of the location of the failure in a given memor… Show more

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Cited by 3 publications
(5 citation statements)
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“…It is the same way for the system. Signature-based approach for diagnosis is already used on RAM memory [2], the proposed methodology tries to apply this method to a complex system.…”
Section: Figure 2 Health Assessment Methodologymentioning
confidence: 99%
“…It is the same way for the system. Signature-based approach for diagnosis is already used on RAM memory [2], the proposed methodology tries to apply this method to a complex system.…”
Section: Figure 2 Health Assessment Methodologymentioning
confidence: 99%
“…Secondly, most of the existing signature-based solutions target only the diagnosis of static faults. To the best of our knowledge, the diagnosis of dynamic faults has been considered in the literature only in [7,8]. In [7], the authors target both static and dynamic faults and propose new algorithms: March SD and the Aggressor Location Algorithm (ALA).…”
Section: Introductionmentioning
confidence: 99%
“…This approach can be considered as an "ad hoc" solution and can be classified among the techniques that introduce dedicated algorithms (and hence additional complexity) for diagnosis purpose. In [8], a signature-based approach for both static and dynamic faults is proposed and consists in the extension of the syndrome is operated without modifying the test algorithm. This extension is made by using information Paper 3.2 INTERNATIONAL TEST CONFERENCE 2 1-4244-4203-0/08/$20.00 ©2008 IEEE taken from the March test execution and from the memory structure itself.…”
Section: Introductionmentioning
confidence: 99%
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“…Memory diagnosis approaches use various methods to identify and diagnose memory faults, e.g., fault pattern identification [6][7][8], fault signatures [1,9,10]. However, they hardly make any distinction between memory array faults and faults in other parts of the memory, such as decoders and peripherals.…”
Section: Introductionmentioning
confidence: 99%