A signature test framework for rapid production testing of RF circuits

Voorakaranam, R.; Cherubal, S.; Chatterjee, Anirban

doi:10.1109/date.2002.998268

Cited by 71 publications

(48 citation statements)

References 4 publications

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“…Obviously, the frequency domain approach introduced here is advantageous in comparison to a time domain approach described in Voorakaranam et al (2002). In particular, here is no need to calculate very large matrices like in the time domain approach (Voorakaranam et al, 2002).…”

Section: Test Signature Synthesismentioning

confidence: 99%

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Spectral Signature Analysis – BIST for RF Front-Ends

2003

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Abstract. In this paper, the Spectral Signature Analysis is presented as a concept for an integrable self-test system (Built-In Self-Test -BIST) for RF front-ends is presented. It is based on modelling the whole RF front-end (transmitter and receiver) on system level, on generating of a Spectral Signature and of evaluating of the Signature Response. Because of using multi-carrier signal as the test signature, the concept is especially useful for tests of linearity and frequency response of front-ends. Due to the presented method of signature response evaluation, this concept can be used for Built-In Self-Correction (BISC) at critical building blocks.

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Section: Test Signature Synthesismentioning

confidence: 99%

“…An approach to generate a time domain test signature that allows the detection of different conventional measured specification parameters is presented in Voorakaranam et al (2002). Our investigations are focused in particular on WLAN-Front-Ends.…”

Section: Test Signature Synthesismentioning

confidence: 99%

Spectral Signature Analysis – BIST for RF Front-Ends

2003

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“…Then, let R(t) be the envelope of the response signal y(t). Using the Rice formulation [17], R(t) can be derived as (4) Signal R(t) results to be a periodic function with period T b =2π/ω b , and hence, can be expanded in its Fourier series as (5) where coefficients a k =0, and b 0 , and b k are given, respectively, by, (6) Equation (6) shows that every harmonic component of R(t) is a linear combination of the magnitudes B 1 and B 2 , and hence, the ratio B 2 /B 1 can be ideally derived from the frequency components of R(t). In this work, we take advantage of the spectral information contained in the response envelope to define a simple digital signature that can be used for testing purposes.…”

Section: Theoretical Basismentioning

confidence: 99%

“…Reducing RF test complexity and cost is still an open research topic that has been addressed in a number of different approaches [1]. Recent work in this area includes defect modeling and failure diagnosis [2]- [5], alternate test [5]- [6], DfT and BIST techniques [7]- [13], etc.…”

Section: Introductionmentioning

confidence: 99%

Low-cost signature test of RF blocks based on envelope response analysis

Barragán

Fiorelli

Vazquez

et al. 2010

2010 15th IEEE European Test Symposium

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Abstract− This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and analysis of the two-tone response envelope of the device under test (DUT). The response envelope is processed to obtain a simple digital signature sensitive to key specifications of the DUT. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.

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“…For a given DUT, there are several test generation algorithms [17] available for optimizing the input test stimulus. In this work, a genetic algorithmbased test generator (as shown in Figure 10) is used due to the nonlinear nature of the search space to avoid local convergence.…”

Section: Test Generationmentioning

confidence: 99%

Built‐in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

et al. 2008

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Recommended by Bozena KaminskaBuilt-In RF test is a challenging problem due to the need to measure the values of complex test specifications on-chip with the precision of external RF test equipment. BIT techniques are necessary for guiding system adaptation during field operation. Prior research has demonstrated that embedded RF sensors can generate significant information about RF circuit performance. In this paper, we propose a test methodology that enables efficient BIT and BIT-enabled tuning of RF systems. A test generation approach is developed that co-optimizes the applied test stimulus, the type of embedded sensors, and the system response capture mechanisms for maximal accuracy of the BIT procedure. This BIT technique is also used to perform diagnostic testing of the transmitter. The information gathered from diagnosis is used to tune the transmitter for improved performance. Simulation results demonstrate that BIT-assisted diagnosis and tuning can be performed with good accuracy using the proposed methodology.

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A signature test framework for rapid production testing of RF circuits

Cited by 71 publications

References 4 publications

Spectral Signature Analysis – BIST for RF Front-Ends

Spectral Signature Analysis – BIST for RF Front-Ends

Low-cost signature test of RF blocks based on envelope response analysis

Built‐in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

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