A simple Bragg detector design for AMS and IBA applications

Müller, Arnold; Döbeli, M.; Seiler, Martin; Synal, Hans-Arno

doi:10.1016/j.nimb.2015.04.056

Cited by 11 publications

(3 citation statements)

References 30 publications

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“…A Bragg-type gas ionization detector run with isobutane 3.5 is used to detect the 14 C ions. Since the energy of the 14 C ions is significantly lower than in the MICADAS system (less than 150 keV), the detector (Müller et al 2015) is operated in the proportional counting region instead of the ion chamber region. Several test measurements taken with the LEA system showed that values of 450 V for the applied voltage and a gas pressure of 9.5 mbar provide the most accurate results in separating the background from the real 14 C events.…”

Section: Detectormentioning

confidence: 99%

LEA—A NOVEL LOW ENERGY ACCELERATOR FOR ¹⁴C DATING

Ramsperger,

De Maria,

Gautschi

et al. 2023

Radiocarbon

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A newly developed compact AMS, LEA (Low Energy Accelerator), is tested and compared with a state-of-the-art AMS system MICADAS (Mini Carbon Dating System), which has a precision performance of better than 1‰ for modern 14C. The main difference between these two systems is the acceleration voltage, which has been reduced from 200 kV with the MICADAS system to 50 kV with the LEA system. In order to execute the final performance tests, exactly same samples (2 sets consisting of 7 standards, 4 blanks, 26 wood samples) are measured on both systems successively. The results show that the LEA system is fully operational, and the performance is entirely comparable with that of the MICADAS system.

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Section: Detectormentioning

confidence: 99%

LEA—A NOVEL LOW ENERGY ACCELERATOR FOR ¹⁴C DATING

Ramsperger,

De Maria,

Gautschi

et al. 2023

Radiocarbon

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“…However, it turns out that for backscattering of particles with relatively low energies, the GICs can be heavily simplified by eliminating most of the internal electrode structure with almost no performance penalty. 172 For higher energy particles more attention must be paid to the flow of charge through the detector to the charge collection anode and a more complex electrode structure to shape the field is needed, together with a Frisch grid to improve the charge collection efficiency. 173 But the new methods have been used to demonstrate a large solid angle annular backscattering detector which works equally well for heavy and light ion backscattering.…”

Section: Gas Ionisation Detectors Of Energetic Particlesmentioning

confidence: 99%

Thin film depth profiling by ion beam analysis

Jeynes

Colaux

2016

Analyst

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The analysis of thin films is of central importance for functional materials, including the very large and active field of nanomaterials. Quantitative elemental depth profiling is basic to analysis, and many techniques exist, but all have limitations and quantitation is always an issue. We here review recent significant advances in ion beam analysis (IBA) which now merit it a standard place in the analyst's toolbox. Rutherford backscattering spectrometry (RBS) has been in use for half a century to obtain elemental depth profiles non-destructively from the first fraction of a micron from the surface of materials: more generally, "IBA" refers to the cluster of methods including elastic scattering (RBS; elastic recoil detection, ERD; and non-Rutherford elastic backscattering, EBS), nuclear reaction analysis (NRA: including particle-induced gamma-ray emission, PIGE), and also particle-induced X-ray emission (PIXE). We have at last demonstrated what was long promised, that RBS can be used as a primary reference technique for the best traceable accuracy available for non-destructive model-free methods in thin films. Also, it has become clear over the last decade that we can effectively combine synergistically the quite different information available from the atomic (PIXE) and nuclear (RBS, EBS, ERD, NRA) methods. Although it is well known that RBS has severe limitations that curtail its usefulness for elemental depth profiling, these limitations are largely overcome when we make proper synergistic use of IBA methods. In this Tutorial Review we aim to briefly explain to analysts what IBA is and why it is now a general quantitative method of great power. Analysts have got used to the availability of the large synchrotron facilities for certain sorts of difficult problems, but there are many much more easily accessible mid-range IBA facilities also able to address (and often more quantitatively) a wide range of otherwise almost intractable thin film questions.

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“…Furthermore a radiation hard gas ionization detector [19] is mounted in transmission geometry behind the sample for precise measurement of the incoming particle rate in the case of thin samples. Thick samples have to be periodically removed to measure the primary ion rate.…”

Section: Fig 1: Top View Of the New Mev-sims Chamber With The Primamentioning

confidence: 99%

Time-of-flight MeV-SIMS with beam induced secondary electron trigger

Schulte-Borchers

Döbeli

Müller

et al. 2016

Nuclear Instruments and Methods in Physics Research Section B:

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A new Time-of-flight MeV Secondary Ion Mass Spectrometry (MeV-SIMS) setup was developed to be used with a capillary microprobe for molecular imaging with heavy primary ions at MeV energies. Due to the low output current of the ion collimating capillary a time-of-flight (ToF) measurement method with high duty cycle is necessary. Secondary electrons from the sample surface and transmitted ions were studied as start signals. They enable measurements with a continuous primary beam and unpulsed ToF spectrometer. Tests with various primary ion beams and sample types have shown that a secondary electron signal is obtained from 30 to 40 % of incident MeV particles. This provides a ToF start signal with considerably better time resolution than the one obtained from transmitted primary ions detected in a radiation hard gas ionization detector. Beam induced secondary electrons therefore allow for MeV-SIMS measurements with reasonable mass resolution at primary ion beam currents in the low fA range.

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A simple Bragg detector design for AMS and IBA applications

Cited by 11 publications

References 30 publications

LEA—A NOVEL LOW ENERGY ACCELERATOR FOR ¹⁴C DATING

LEA—A NOVEL LOW ENERGY ACCELERATOR FOR ¹⁴C DATING

Thin film depth profiling by ion beam analysis

Time-of-flight MeV-SIMS with beam induced secondary electron trigger

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A simple Bragg detector design for AMS and IBA applications

Cited by 11 publications

References 30 publications

LEA—A NOVEL LOW ENERGY ACCELERATOR FOR 14C DATING

LEA—A NOVEL LOW ENERGY ACCELERATOR FOR 14C DATING

Thin film depth profiling by ion beam analysis

Time-of-flight MeV-SIMS with beam induced secondary electron trigger

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Product

Resources

About

LEA—A NOVEL LOW ENERGY ACCELERATOR FOR ¹⁴C DATING

LEA—A NOVEL LOW ENERGY ACCELERATOR FOR ¹⁴C DATING