A simple broad-band device de-embedding method using an automatic network analyzer with time-domain option

Gronau, Gregor; Wolff, I.

doi:10.1109/22.21617

Cited by 45 publications

(22 citation statements)

References 3 publications

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“…6 and 8 through the exact SW current representation, and the measurements given in ref. 21. An excellent agreement between our and previous results can be observed.…”

Section: Numerical Results and Discussionsupporting

confidence: 92%

“…(17) are I where the Fourier transforms of the PEWs (19) and (20), considering the scaling factor P, and substituting q with q through (21), are given by %(a. P . r)) (23) and (24) we can conclude that the spectral PEWs (22) are provided with the characteristics we had been looking for, namely the absence of singularities and a relatively fast numerical computation.…”

Section: The Pseudo-exponential Windowmentioning

confidence: 99%

See 1 more Smart Citation

An expansion function suited for fast full‐wave spectral domain analysis of microstrip discontinuities

Cicchetti

Faraone

1994

Int. J. Microw. Mill.‐Wave Comput.‐Aided Eng.

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“…6 and 8 through the exact SW current representation, and the measurements given in ref. 21. An excellent agreement between our and previous results can be observed.…”

Section: Numerical Results and Discussionsupporting

confidence: 92%

Section: The Pseudo-exponential Windowmentioning

confidence: 99%

An expansion function suited for fast full‐wave spectral domain analysis of microstrip discontinuities

Cicchetti

Faraone

1994

Int. J. Microw. Mill.‐Wave Comput.‐Aided Eng.

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“…5 (b) and (c) [21], [22]. Equivalently, since 8 ll and 8 22 Equation (7) does not account for the influence of the transition discontinuity at the probe-tips.…”

Section: Abcd Matrix Based Methods -Diff Erent Approachmentioning

confidence: 98%

“…In [20], [21], [22], [23]. Using time gating capability it is possible to extract 8 11 of the error box by measuring only one line standard.…”

Section: Abcd Matrix Based Methods -Diff Erent Approachmentioning

confidence: 99%

Highly accurate frequency/time domain characterization of transmission lines and passives for SiP applications up to 65 GHz

Wojnowski

Engl

Weigel

2007

2007 69th ARFTG Conference

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Frequency (GHz)Fig. 1. The extracted inductance of a spiral inductor as a function of reference impedance. • No ren orm. • l ref = 20 ... Z = Z -5% ref 0 • Z = Z + 5% ref 0 Zref = Re 2 0 2.5 4.5 I 4 cThe only method that does not need the characteristics of the reflection calibration standards is the Thru-Reflect-Line (TRL) method [6], [7]. However, the reference impedance in the TRL calibration corresponds to the characteristic impedance of the lines used in the calibration. This in general complex impedance is usually not known. In Fig. 1 the influence of the reference impedance on the extracted inductance of a single layer spiral inductor is shown. If we use the Y 11 -based definition of the inductance L = Im(Yii 1 ) / w we get(1 -8 11 )(1 + 8 22) + 8 12821where 8 i j are the S-parameters referenced to Zo impedance. This means that the accuracy of the inductance determination is directly proportional to the impedance accuracy. Thus, the accurate determination of the complex characteristic impedance is of great importance, since this value determines the accuracy of the RLCG-parameter de-embedding. Moreover, Abstract-Accurate determination of the characteristic impedance determines the accuracy of the characterization of transmission lines and passive devices. In this paper, we present a novel, time-domain based procedure for the complex characteristic impedance determination. The method is insensitive to changes in the reference plane and the parasitic shunt admittance at the probe tips. For highly accurate passives characterization, a modification of the Thru-Refleet-Line (TRL) calibration algorithm is proposed. It enables the use of the TRL method to deembed components having the ports on different metallization levels. Additionally, a comprehensive overview and evaluation of both frequency and time-domain methods for characteristic impedance determination is included for completeness. We present measurement results of transmission lines and spiral inductors fabricated in MCM-D technology on low-and highresistivity substrates up to 65 GHz.

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“…Our approach is based on a broad-band device de-embedding method using the automatic network analyzer time-domain option as described by Gronau and Wolff [44,45]. The signal flow chart of the (DUT) is characterized by S 11 , S 21 , S 12 ,and S 22 .…”

Section: Microstrip Device Under Test De-embeddingmentioning

confidence: 99%

Analysis and Measurements of Arbitrarily Shaped Open Microstrip Structures

Maricevic¹,

Sarkar²

1997

PIER

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A simple broad-band device de-embedding method using an automatic network analyzer with time-domain option

Cited by 45 publications

References 3 publications

An expansion function suited for fast full‐wave spectral domain analysis of microstrip discontinuities

An expansion function suited for fast full‐wave spectral domain analysis of microstrip discontinuities

Highly accurate frequency/time domain characterization of transmission lines and passives for SiP applications up to 65 GHz

Analysis and Measurements of Arbitrarily Shaped Open Microstrip Structures

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