A simple calibration algorithm for partially leaky model multiport vector network analyzers

Abstract

Calibration of leaky multiport vector network analyzers can be a long and time consuming procedure, unless calibration model and number of standard connections are somehow optimized. In this paper we present an optimized solution €or a practical set of multiport problems, where calibration model can be divided in two separate teaky halves, neglecting leakage between them. This problem is typical for multiport onwafer measurements, where mdti-signal probes (e.g. GSGSG) are implied, We will show that with a proper choice of calibration standards, the optimized calbration procedure takes the same time of a classical two port LRM or TRL.Index Tem-Multiport VNA, multiport S-parameters, multiport calibration, leaky calibration, multiport error model, leaky error model, on-wafer calibration.

On-wafer calibration algorithm for partially leaky multiport vector network analyzers

“…Some experiments to validate the proposed methodology were performed on a four-port coaxial system [25]. The setup Fig.…”

“…In [25], a new multiport error model and its calibration procedure, called "half-leaky calibration," were introduced. In this model, the error coefficients are split into two separate leaky halves with the same number of ports.…”

“…In this model, the error coefficients are split into two separate leaky halves with the same number of ports. In [25], some preliminary verifications of the model and calibration procedure, performed in a coaxial environment, were shown. In this paper, we will present further and more complete on-wafer verifications, which highlight some new characteristics of the novel technique.…”

“…Section II presents the mathematical formulation of the problem and an optimized calibration procedure where the number of required standard insertions is minimized. Section III shows the results of some measurements performed in a coaxial environment [25], aimed at the methodology validation, while Section IV shows the results of this new technique applied to on-wafer measurements.…”

Multiport calibration for microwave tomography systems

“…Therefore, it is necessary to find a fitting error model for the setup at hand. Several error models for multiport calibration have been published before [1][2] [5]. All account for directivity errors, source mismatching and tracking errors at all measurement ports.…”