2010
DOI: 10.1063/1.3430069
|View full text |Cite
|
Sign up to set email alerts
|

A simple external resistance heating diamond anvil cell and its application for synchrotron radiation x-ray diffraction

Abstract: A simple external heating assemblage allowing diamond anvil cell experiments at pressures up to 34 GPa and temperatures up to 653 K was constructed. This cell can be connected to the synchrotron radiation conveniently. The design and construction of this cell are fully described, as well as its applications for x-ray diffraction. Heating is carried out by using an external-heating system, which is made of NiCr resistance wire, and the temperature was measured by a NiCr-NiSi or PtRh-Pt thermocouple. We showed t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
14
0

Year Published

2012
2012
2017
2017

Publication Types

Select...
7
1

Relationship

3
5

Authors

Journals

citations
Cited by 29 publications
(14 citation statements)
references
References 23 publications
0
14
0
Order By: Relevance
“…First we set the pressure at 6.21 GPa at RT, and then we increased the temperature gradually to 390 K (see the Methods and also ref. 42). When approaching and stabilizing the temperature at 390 K, the pressure first increased a little to 6.27 GPa and decreased gradually and finally stabilized around 6.05-6.01 GPa.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…First we set the pressure at 6.21 GPa at RT, and then we increased the temperature gradually to 390 K (see the Methods and also ref. 42). When approaching and stabilizing the temperature at 390 K, the pressure first increased a little to 6.27 GPa and decreased gradually and finally stabilized around 6.05-6.01 GPa.…”
Section: Discussionmentioning
confidence: 99%
“…A resistance-heating system (ref. 42) was used to heat the sample in DAC, and temperature was measured by the NiCr-NiSi thermocouple with its precision o±1°C.…”
Section: Methodsmentioning
confidence: 99%
“…Following this, the temperature was lowered down to 300 K in 200 K steps. At each P-T condition, an X-ray diffraction pattern was collected after the experiment temperature was maintained for ~600 s. The typical exposure time for collecting the diffraction patterns of the sample and the pressure marker was 600 s. Details of the experimental setup and cell assembly are described in Fan et al (2010).…”
Section: High-temperature and High-pressure Powder X-ray Diffraction mentioning
confidence: 99%
“…For each P-T condition, an X-ray diffraction pattern was collected. The spectrums were selected after the experiment temperature was kept for ~600 s. Typical exposure times for collecting diffraction patterns of the sample and the pressure marker were 600 s. Details of the experimental setup and cell assembly were described in Fan et al (2010).…”
Section: Room-temperature and High-pressure Single-crystal X-ray Diffmentioning
confidence: 99%