1982
DOI: 10.1063/1.329971
|View full text |Cite
|
Sign up to set email alerts
|

A simple model for the hysteretic behavior of ZnS:Mn thin film electroluminescent devices

Abstract: A model is proposed for the observed hysteretic behavior of ac-coupled ZnS:Mn thin-film electroluminescent devices. The following mechanisms are invoked: (1) tunnel injection from ZnS-dielectric interfaces (ℰ4106 V/cm), (2) electron-hole pair generation, (3) deep trapping of holes, leading to space-charge formation, (4) charge storage at the ZnS-dielectric interfaces, and (5) direct recombination of injected electrons and trapped holes. When these mechanisms are combined in a self-consistent numerical simulati… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
19
0

Year Published

1992
1992
2007
2007

Publication Types

Select...
5
2
1

Relationship

0
8

Authors

Journals

citations
Cited by 111 publications
(21 citation statements)
references
References 15 publications
2
19
0
Order By: Relevance
“…The 7.3ϫ10 16 cm Ϫ3 static space charge estimate of Ohmi et al 13 is within the range of our estimate. Moreover, this static space charge estimate is comparable to the 5.0ϫ10 16 cm Ϫ3 experimental value of the trapped hole concentration deduced by Howard et al 21 in their analysis of hysteretic behavior in ZnS:Mn ACTFEL devices. Although Ohmi et al 13 and our ACTFEL devices do not exhibit brightness-voltage hysteresis, it seems likely that the hole trapping mechanism proposed by Howard et al could be the origin of static space charge.…”
Section: A Estimation Of the Static Space Charge Densitysupporting
confidence: 78%
See 1 more Smart Citation
“…The 7.3ϫ10 16 cm Ϫ3 static space charge estimate of Ohmi et al 13 is within the range of our estimate. Moreover, this static space charge estimate is comparable to the 5.0ϫ10 16 cm Ϫ3 experimental value of the trapped hole concentration deduced by Howard et al 21 in their analysis of hysteretic behavior in ZnS:Mn ACTFEL devices. Although Ohmi et al 13 and our ACTFEL devices do not exhibit brightness-voltage hysteresis, it seems likely that the hole trapping mechanism proposed by Howard et al could be the origin of static space charge.…”
Section: A Estimation Of the Static Space Charge Densitysupporting
confidence: 78%
“…It is interesting to speculate on the physical nature of these hole traps. Howard et al 21 proposed that the deep hole traps responsible for B -V hysteresis arise from the formation of Mn complexes. It is possible that static space charge is associated with such Mn complexes.…”
Section: B the Origin Of Static Space Chargementioning
confidence: 99%
“…The presence of Mn could be a source of the ''hysteresis'' phenomenon, since Mn is well known as the cause of a similar hysteresis phenomenon in ZnS. 22 Another possibility is the existence of Eu-related deep traps, which can also explain the high resistivity of our samples. The occurrence of divalent Eu ion ͑Eu 2ϩ ), possibly through electron transfer or impact ionization, was also considered but no Eu 2ϩ -related broad emission was detected.…”
Section: ͓S0003-6951͑00͒04312-6͔mentioning
confidence: 95%
“…their inherent memory, results from the existence of a hysteresis in the voltage (V) dependences of the luminance (L) and the transferred charge (Q) [6,7]. The hysteresis in these characteristics is due to a positive feedback between three main physical processes proceeding in TFELS: the tunnel injection of initial free electrons, the impact multiplication of these free electrons, and the formation of a positive space charge (PSC) which results in an enhancement of the field in the ZnS : Mn film [8][9][10][11][12]. Main centers which are responsible for the impact formation of PSC are isovalent traps ½Mn 2þ…”
Section: Introductionmentioning
confidence: 99%