2000
DOI: 10.1002/(sici)1098-2760(20000505)25:3<191::aid-mop10>3.0.co;2-5
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A simple procedure to determine the complex permittivity of materials without ambiguity from reflection measurements

Abstract: A new simple and fast procedure to calculate the dielectric properties of materials without ambiguity has been developed by transforming one‐port reflection measurements, made by an automatic network analyzer, into permittivity values. The measurements needed for the dielectric characterization are taken from two samples of different lengths embedded inside two short‐circuited waveguides with a length relation of 1:n. The technique is validated by good agreement with previously reported results. © 2000 John Wi… Show more

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Cited by 15 publications
(8 citation statements)
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“…The first advantage of the proposed method is that it does not require transmission Sparameter for electromagnetic property extraction as compared with the methods [7]- [34], [50]- [52]. Second advantage of the proposed method is that it is applicable for retrieval of electromagnetic properties of a target layer within an inhomogeneous structure contrary to the transmissionreflection methods [7]- [10], [12]- [15], [17]- [19] and the reflection-only methods [35]- [49] which are applicable for one-layer (homogeneous) structures. It should be specifically mentioned here that this flexibility of our method distinguishes it from the method in [49], which extracts electromagnetic properties of a metal-backed homogeneous (one-layer) medium using oblique and normal incidence Sparameters, in that it could be applied for electromagnetic property extraction of any target layer within a metal-backed inhomogeneous structure using oblique and normal incidence S-parameters.…”
Section: Extraction Processmentioning
confidence: 99%
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“…The first advantage of the proposed method is that it does not require transmission Sparameter for electromagnetic property extraction as compared with the methods [7]- [34], [50]- [52]. Second advantage of the proposed method is that it is applicable for retrieval of electromagnetic properties of a target layer within an inhomogeneous structure contrary to the transmissionreflection methods [7]- [10], [12]- [15], [17]- [19] and the reflection-only methods [35]- [49] which are applicable for one-layer (homogeneous) structures. It should be specifically mentioned here that this flexibility of our method distinguishes it from the method in [49], which extracts electromagnetic properties of a metal-backed homogeneous (one-layer) medium using oblique and normal incidence Sparameters, in that it could be applied for electromagnetic property extraction of any target layer within a metal-backed inhomogeneous structure using oblique and normal incidence S-parameters.…”
Section: Extraction Processmentioning
confidence: 99%
“…Then our method was implemented to retrieve ε r2 and µ r2 of the synthesized MM slab. In implementation of our method, we applied the 'fmincon' function of MAT-LAB© with the 'active-set' algorithm using initial electromagnetic properties of the FR4 material, the synthesized MM slab in (35) and 36 and 11(b) illustrate the real parts of the extracted ε r2 and µ r2 (shown by circle symbol) for the perpendicular polarization when N max = 10 and N max = 40. For brevity, the imaginary parts of the extracted ε r2 and µ r2 are not demonstrated.…”
Section: Analyses Of Noise Effect Iterative Error and Misalignmentmentioning
confidence: 99%
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“…Meanwhile, microwave systems accompanied with the amplitude measurements are much simpler, resulting in a more cost-effective system. Various reflection-only and/or scalar methods have been suggested in the literature so far [15,[17][18][19][20]. Here, some more important studies are reviewed.…”
Section: Introductionmentioning
confidence: 99%