2015
DOI: 10.2494/photopolymer.28.683
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A Simulation Study on Defectivity in Directed Self-assembly Lithography

Abstract: We have investigated the generation mechanisms of pattern defects in directed self-assembly (DSA) lithography using a simulation method based on self-consistent field theory (SCFT). The SCFT simulation results could reproduce grid defects, which are considered to be a kind of hexagonally perforated lamellar (HPL) metastable phase, as one of the characteristic pattern defects in the coordinated line epitaxy (COOL) DSA lithography process using polystyrene-block-poly(methyl methacrylate) (PS-b-PMMA). We found th… Show more

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Cited by 5 publications
(1 citation statement)
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“…The EBAC system revealed the line breaking with approximately 25 nm in length on the metal wire line pattern with 9 nm in width. It is considered that the line breaking was caused by the short defect, so called the grid defect [29][30][31][32][33]. Figure 9 shows defect classification of the metal wire circuits with 9 nm in width.…”
Section: Resultsmentioning
confidence: 99%
“…The EBAC system revealed the line breaking with approximately 25 nm in length on the metal wire line pattern with 9 nm in width. It is considered that the line breaking was caused by the short defect, so called the grid defect [29][30][31][32][33]. Figure 9 shows defect classification of the metal wire circuits with 9 nm in width.…”
Section: Resultsmentioning
confidence: 99%