2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) 2017
DOI: 10.1109/pvsc.2017.8521498
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A Simulation Study on Radiative Recombination Analysis in CIGS Solar Cell

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Cited by 3 publications
(4 citation statements)
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“…Figure 9 shows the generated SRH and radiative recombination profiles (for T = 300 K) at V = V OC . It was found that the interface of CdS/CIGS and SCR act as recombination centers in the structure, matching the observations made by [50]. However, in this study radiative recombination rate seems to be higher at the depletion region and QNR while SRH is significantly more dominant at the front interface.…”
Section: Optimizing Bandgap Energy Of Mose 2 Layer For Compatibility ...supporting
confidence: 89%
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“…Figure 9 shows the generated SRH and radiative recombination profiles (for T = 300 K) at V = V OC . It was found that the interface of CdS/CIGS and SCR act as recombination centers in the structure, matching the observations made by [50]. However, in this study radiative recombination rate seems to be higher at the depletion region and QNR while SRH is significantly more dominant at the front interface.…”
Section: Optimizing Bandgap Energy Of Mose 2 Layer For Compatibility ...supporting
confidence: 89%
“…The principle of temperature-and illuminationdependent V OC analysis is to identify and quantify Shockley-Read-Hall (SRH) as well as radiative recombination rates in different regions of the CIGS absorber-namely, the heterointerface, depletion region and quasi-neutral region (QNR). A study conducted by Paul et al [50] depicted that most of the recombination occurs near the CdS buffer/CIGS absorber interface and in the depletion region, with Shockley-Read-Hall (SRH) recombination dominating over radiative recombination when operating temperature, T is set at 300 K. By emulating the investigation carried out by Paul et al, simulation study on the relationship of recombination rate and the depth of the absorber layer was carried out using the baseline CIGS model at V = V OC . The MoSe 2 interface layer and absorber bandgap grading was not incorporated in this baseline CIGS model.…”
Section: Optimizing Bandgap Energy Of Mose 2 Layer For Compatibility ...mentioning
confidence: 99%
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“…Significant increases after PDT were observed for all devices. Increased minority carrier lifetime is primarily attributed to reduced nonradiative recombination because τ bulk = 7–224 ns is well below the radiative lifetime, τ R ≈ 1000 ns ( τ R = 1/(BN A ) where B = 1.67 × 10 −10 cm 3 s −1 [ 34 ] and N A values are listed in Table 2 and discussed below. The τ bulk ‐associated voltage increase can be estimated by [ 35 ] ΔVOC, bulk=kTqln(τbulk,PDTτbulk,untreated)$$\cdot V_{\text{OC} , \text{ bulk}} = \frac{k T}{q} \text{ln} \left(\right.…”
Section: Resultsmentioning
confidence: 99%